Spatial resolution limits for synchrotron-based spectromicroscopy in the mid- and near-infrared

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Spatial resolution tests were performed on beamline 1.4.4 at the Advanced Light Source in Berkeley, CA, USA, a third-generation synchrotron light source. This beamline couples the high-brightness synchrotron source to a Thermo-Electron Continumum XL infrared microscope. Two types of resolution tests were performed in both the mid-IR and near-IR. The results are compared with a diffraction-limited spot size theory. At shorter near-IR wavelengths the experimental results begin to deviate from diffraction-limited so a combined diffraction-limit and electron-beam-source-size model is employed. This description shows how the physical electron beam size of the synchrotron source begins to dominate the focused spot size ... continued below

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Levenson, Erika; Lerch, Philippe & Martin, Michael C. January 12, 2008.

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Spatial resolution tests were performed on beamline 1.4.4 at the Advanced Light Source in Berkeley, CA, USA, a third-generation synchrotron light source. This beamline couples the high-brightness synchrotron source to a Thermo-Electron Continumum XL infrared microscope. Two types of resolution tests were performed in both the mid-IR and near-IR. The results are compared with a diffraction-limited spot size theory. At shorter near-IR wavelengths the experimental results begin to deviate from diffraction-limited so a combined diffraction-limit and electron-beam-source-size model is employed. This description shows how the physical electron beam size of the synchrotron source begins to dominate the focused spot size at higher energies. The transition from diffraction-limited to electron-beam-size-limited performance is a function of storage-ring parameters and the optical demagnification within the beamline and microscope optics. The discussion includes how different facilities, beamlines and microscopes will affect the achievable spatial resolution. As synchrotron light sources and other next-generation accelerators such as energy-recovery LINACs and free-electron lasers achieve smaller beam emittances, beta-functions and/or energy spreads, diffraction-limited performance can continue to higher-energy beams, perhaps ultimately into the extreme ultraviolet.

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  • Journal Name: Journal of Synchrotron Radiation; Journal Volume: 15; Journal Issue: 4; Related Information: Journal Publication Date: July 2008

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  • Report No.: LBNL-835E
  • Grant Number: DE-AC02-05CH11231
  • DOI: 10.1107/S0909049508004524 | External Link
  • Office of Scientific & Technical Information Report Number: 938511
  • Archival Resource Key: ark:/67531/metadc897053

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  • January 12, 2008

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  • Sept. 27, 2016, 1:39 a.m.

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  • Jan. 4, 2017, 4:51 p.m.

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Levenson, Erika; Lerch, Philippe & Martin, Michael C. Spatial resolution limits for synchrotron-based spectromicroscopy in the mid- and near-infrared, article, January 12, 2008; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc897053/: accessed August 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.