Soft x-ray microscopy - a powerful analytical tool to image magnetism down to fundamental length and times scales

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The magnetic properties of low dimensional solid state matter is of the utmost interest both scientifically as well as technologically. In addition to the charge of the electron which is the base for current electronics, by taking into account the spin degree of freedom in future spintronics applications open a new avenue. Progress towards a better physical understanding of the mechanism and principles involved as well as potential applications of nanomagnetic devices can only be achieved with advanced analytical tools. Soft X-ray microscopy providing a spatial resolution towards 10nm, a time resolution currently in the sub-ns regime and inherent elemental ... continued below

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17

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Fischer, Peter August 1, 2008.

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The magnetic properties of low dimensional solid state matter is of the utmost interest both scientifically as well as technologically. In addition to the charge of the electron which is the base for current electronics, by taking into account the spin degree of freedom in future spintronics applications open a new avenue. Progress towards a better physical understanding of the mechanism and principles involved as well as potential applications of nanomagnetic devices can only be achieved with advanced analytical tools. Soft X-ray microscopy providing a spatial resolution towards 10nm, a time resolution currently in the sub-ns regime and inherent elemental sensitivity is a very promising technique for that. This article reviews the recent achievements of magnetic soft X-ray microscopy by selected examples of spin torque phenomena, stochastical behavior on the nanoscale and spin dynamics in magnetic nanopatterns. The future potential with regard to addressing fundamental magnetic length and time scales, e.g. imaging fsec spin dynamics at upcoming X-ray sources is pointed out.

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17

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  • Journal Name: AAPPS Bulletin

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  • Report No.: LBNL-962E
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 940774
  • Archival Resource Key: ark:/67531/metadc896518

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • August 1, 2008

Added to The UNT Digital Library

  • Sept. 27, 2016, 1:39 a.m.

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  • Oct. 2, 2017, 5:37 p.m.

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Fischer, Peter. Soft x-ray microscopy - a powerful analytical tool to image magnetism down to fundamental length and times scales, article, August 1, 2008; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc896518/: accessed August 14, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.