SIEMENS ADVANCED QUANTRA FTICR MASS SPECTROMETER FOR ULTRA HIGH RESOLUTION AT LOW MASS Page: 4 of 31
This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided to Digital Library by the UNT Libraries Government Documents Department.
The following text was automatically extracted from the image on this page using optical character recognition software:
REVIEWS AND APPROVALS
W.A. Spencer, Analytical Development
L. L. Tovo, Analytical Development
J.L. Venzie, Analytical Development
L. M. Chandler, Manager, Analytical Development
M. J. Barnes, Manager, Spectroscopy and Separations
P. F. Cloessner, Manager, Defense Programs Technology
Here’s what’s next.
This report can be searched. Note: Results may vary based on the legibility of text within the document.
Tools / Downloads
Get a copy of this page or view the extracted text.
Citing and Sharing
Basic information for referencing this web page. We also provide extended guidance on usage rights, references, copying or embedding.
Reference the current page of this Report.
Spencer, W & Laura Tovo, L. SIEMENS ADVANCED QUANTRA FTICR MASS SPECTROMETER FOR ULTRA HIGH RESOLUTION AT LOW MASS, report, July 8, 2008; [Aiken, South Carolina]. (digital.library.unt.edu/ark:/67531/metadc895411/m1/4/: accessed February 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.