Spatial resolution limits for synchrotron-based infrared spectromicroscopy

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Detailed spatial resolution tests were performed on beamline 1.4.4 at the Advanced Light Source synchrotron facility in Berkeley, CA. The high-brightness synchrotron source is coupled at this beamline to a Thermo-Electron Continumum XL infrared microscope. Two types of resolution tests in both the mid-IR (using a KBr beamsplitter and an MCT-A* detector) and in the near-IR (using a CaF2 beamsplitter and an InGaAS detector) were performed and compared to a simple diffraction-limited spot size model. At the shorter wavelengths in the near-IR the experimental results begin to deviate from only diffraction-limited. The entire data set is fit using a combined ... continued below

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Levenson, Erika; Lerch, Philippe & Martin, Michael C. October 15, 2007.

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Detailed spatial resolution tests were performed on beamline 1.4.4 at the Advanced Light Source synchrotron facility in Berkeley, CA. The high-brightness synchrotron source is coupled at this beamline to a Thermo-Electron Continumum XL infrared microscope. Two types of resolution tests in both the mid-IR (using a KBr beamsplitter and an MCT-A* detector) and in the near-IR (using a CaF2 beamsplitter and an InGaAS detector) were performed and compared to a simple diffraction-limited spot size model. At the shorter wavelengths in the near-IR the experimental results begin to deviate from only diffraction-limited. The entire data set is fit using a combined diffraction-limit and demagnified electron beam source size model. This description experimentally verifies how the physical electron beam size of the synchrotron source demagnified to the sample stage on the endstation begins to dominate the focussed spot size and therefore spatial resolution at higher energies. We discuss how different facilities, beamlines, and microscopes will affect the achievable spatial resolution.

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  • Journal Name: Infrared Physics&Technology; Journal Volume: 51; Journal Issue: 5; Related Information: Journal Publication Date: May 2008

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  • Report No.: LBNL-834E
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 937218
  • Archival Resource Key: ark:/67531/metadc895158

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • October 15, 2007

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  • Sept. 27, 2016, 1:39 a.m.

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  • Jan. 4, 2017, 4:39 p.m.

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Levenson, Erika; Lerch, Philippe & Martin, Michael C. Spatial resolution limits for synchrotron-based infrared spectromicroscopy, article, October 15, 2007; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc895158/: accessed November 18, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.