Sharp Reduction of the Secondary Electron Emission Yield from Grooved Surfaces

PDF Version Also Available for Download.

Description

The effect of an artificially-enhanced rough surface on the secondary electron emission yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with Monte-Carlo simulations.

Physical Description

18 pages

Creation Information

Pivi, M.T.F.; King, F.K.; Kirby, R.E.; Ruabenheimer, T.O.; Stupakov, G.; /SLAC et al. November 28, 2007.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

The effect of an artificially-enhanced rough surface on the secondary electron emission yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with Monte-Carlo simulations.

Physical Description

18 pages

Source

  • Journal Name: Journal of Applied Physics

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Report No.: SLAC-PUB-13020
  • Grant Number: AC02-76SF00515
  • Office of Scientific & Technical Information Report Number: 920274
  • Archival Resource Key: ark:/67531/metadc895140

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • November 28, 2007

Added to The UNT Digital Library

  • Sept. 27, 2016, 1:39 a.m.

Description Last Updated

  • Dec. 9, 2016, 7:11 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 4

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

Pivi, M.T.F.; King, F.K.; Kirby, R.E.; Ruabenheimer, T.O.; Stupakov, G.; /SLAC et al. Sharp Reduction of the Secondary Electron Emission Yield from Grooved Surfaces, article, November 28, 2007; [Menlo Park, California]. (digital.library.unt.edu/ark:/67531/metadc895140/: accessed November 19, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.