Flat-Field Calibration of CCD Detector for Long TraceProfilers

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The next generation of synchrotrons and free electron lasersrequires x-ray optical systems with extremely high-performance,generally, of diffraction limited quality. Fabrication and use of suchoptics requires highly accurate metrology. In the present paper, wediscuss a way to improve the performance of the Long Trace Profiler(LTP), a slope measuring instrument widely used at synchrotron facilitiesto characterize x-ray optics at high-spatial-wavelengths fromapproximately 2 mm to 1 m. One of the major sources of LTP systematicerror is the detector. For optimal functionality, the detector has topossess the smallest possible pixel size/spacing, a fast method ofshuttering, and minimal non-uniformity of pixel-to-pixel photoresponse.While the first two ... continued below

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Kirschman, Jonathan L.; Domning, Edward E.; Franck, Keith D.; Irick, Steve C.; MacDowell, Alastair A.; McKinney, Wayne R. et al. July 31, 2007.

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The next generation of synchrotrons and free electron lasersrequires x-ray optical systems with extremely high-performance,generally, of diffraction limited quality. Fabrication and use of suchoptics requires highly accurate metrology. In the present paper, wediscuss a way to improve the performance of the Long Trace Profiler(LTP), a slope measuring instrument widely used at synchrotron facilitiesto characterize x-ray optics at high-spatial-wavelengths fromapproximately 2 mm to 1 m. One of the major sources of LTP systematicerror is the detector. For optimal functionality, the detector has topossess the smallest possible pixel size/spacing, a fast method ofshuttering, and minimal non-uniformity of pixel-to-pixel photoresponse.While the first two requirements are determined by choice of detector,the non-uniformity of photoresponse of typical detectors such as CCDcameras is around 2-3 percent. We describe a flat-field calibration setupspecially developed for calibration of CCD camera photo-response and darkcurrent with an accuracy of better than 0.5 percent. Such accuracy isadequate for use of a camera as a detector for an LTP with performance of~;0.1 microradian (rms). We also present the design details of thecalibration system and results of calibration of a DALSA CCD camera usedfor upgrading our LTP-II instrument at the ALS Optical MetrologyLaboratory.

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  • SPIE Optics and Photonics 2007: Conference 6704,Advances in Metrology for X-Ray and EUV Optics II, San Diego, CA, USA,26-30 August 2007

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  • Report No.: LBNL--62492
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 926895
  • Archival Resource Key: ark:/67531/metadc894894

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  • July 31, 2007

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  • Sept. 27, 2016, 1:39 a.m.

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  • Oct. 31, 2016, 3:50 p.m.

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Kirschman, Jonathan L.; Domning, Edward E.; Franck, Keith D.; Irick, Steve C.; MacDowell, Alastair A.; McKinney, Wayne R. et al. Flat-Field Calibration of CCD Detector for Long TraceProfilers, article, July 31, 2007; (digital.library.unt.edu/ark:/67531/metadc894894/: accessed June 23, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.