Real-time X-ray Diffraction Measurements of Shocked Polycrystalline Tin and Aluminum

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A new, fast, single-pulse x-ray diffraction (XRD) diagnostic for determining phase transitions in shocked polycrystalline materials has been developed. The diagnostic consists of a 37-stage Marx bank high-voltage pulse generator coupled to a needle-and-washer electron beam diode via coaxial cable, producing line and bremsstrahlung x-ray emission in a 35-ns pulse. The characteristic Kα lines from the selected anodes of silver and molybdenum are used to produce the diffraction patterns, with thin foil filters employed to remove the characteristic Kβ line emission. The x-ray beam passes through a pinhole collimator and is incident on the sample with an approximately 3-mm by ... continued below

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Dane V. Morgan, Don Macy, Gerald Stevens November 22, 2008.

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A new, fast, single-pulse x-ray diffraction (XRD) diagnostic for determining phase transitions in shocked polycrystalline materials has been developed. The diagnostic consists of a 37-stage Marx bank high-voltage pulse generator coupled to a needle-and-washer electron beam diode via coaxial cable, producing line and bremsstrahlung x-ray emission in a 35-ns pulse. The characteristic Kα lines from the selected anodes of silver and molybdenum are used to produce the diffraction patterns, with thin foil filters employed to remove the characteristic Kβ line emission. The x-ray beam passes through a pinhole collimator and is incident on the sample with an approximately 3-mm by 6-mm spot and 1° full-width-half-maximum (FWHM) angular divergence in a Bragg-reflecting geometry. For the experiments described in this report, the angle between the incident beam and the sample surface was 8.5°. A Debye-Scherrer diffraction image was produced on a phosphor located 76 mm from the polycrystalline sample surface. The phosphor image was coupled to a charge-coupled device (CCD) camera through a coherent fiberoptic bundle. Dynamic single-pulse XRD experiments were conducted with thin foil samples of tin, shock loaded with a 1-mm vitreous carbon back window. Detasheet high explosive with a 2-mm-thick aluminum buffer was used to shock the sample. Analysis of the dynamic shock-loaded tin XRD images revealed a phase transformation of the tin beta phase into an amorphous or liquid state. Identical experiments with shock-loaded aluminum indicated compression of the face-centered-cubic (fcc) aluminum lattice with no phase transformation.

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  • Journal Name: Review of Scientific Instruments; Journal Volume: 79; Journal Issue: 11

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  • Report No.: DOE/NV/25946--498
  • Grant Number: DE-AC52-06NA25946
  • DOI: 10.1063/1.3030855 | External Link
  • Office of Scientific & Technical Information Report Number: 943979
  • Archival Resource Key: ark:/67531/metadc894795

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  • November 22, 2008

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  • Sept. 27, 2016, 1:39 a.m.

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  • Dec. 16, 2016, 12:51 p.m.

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Dane V. Morgan, Don Macy, Gerald Stevens. Real-time X-ray Diffraction Measurements of Shocked Polycrystalline Tin and Aluminum, article, November 22, 2008; United States. (digital.library.unt.edu/ark:/67531/metadc894795/: accessed October 23, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.