Development of an ultra-high resolution diffraction grating forsoft x-rays

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Resonant Inelastic X-ray Scattering (RIXS) is the one of themost powerful methods for investigation of the electronic structure ofmaterials, specifically of excitations in correlated electron systems.However the potential of the RIXS technique has not been fully exploitedbecause conventional grating spectrometers have not been capable ofachieving the extreme resolving powers that RIXS can utilize. State ofthe art spectrometers in the soft x-ray energy range achieve ~;0.25 eVresolution, compared to the energy scales of soft excitations andsuperconducting gap openings down to a few meV. Development ofdiffraction gratings with super high resolving power is necessary tosolve this problem. In this paper we study ... continued below

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Voronov, Dmitriy L.; Cambie, Rossana; Feshchenko, Ruslan M.; Gullikson, Eric M.; Padmore, Howard A.; Vinogradov, Alexander V. et al. August 21, 2007.

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Resonant Inelastic X-ray Scattering (RIXS) is the one of themost powerful methods for investigation of the electronic structure ofmaterials, specifically of excitations in correlated electron systems.However the potential of the RIXS technique has not been fully exploitedbecause conventional grating spectrometers have not been capable ofachieving the extreme resolving powers that RIXS can utilize. State ofthe art spectrometers in the soft x-ray energy range achieve ~;0.25 eVresolution, compared to the energy scales of soft excitations andsuperconducting gap openings down to a few meV. Development ofdiffraction gratings with super high resolving power is necessary tosolve this problem. In this paper we study the possibilities offabrication of gratings of resolving power of up to 106 for the 0.5 1.5KeV energy range. This energy range corresponds to all or most of theuseful dipole transitions for elements of interest in most correlatedelectronic systems, i.e., oxygen K-edge of relevance to all oxides, thetransition metal L2,3 edges, and the M4,5 edges of the rare earths.Various approaches based on different kinds of diffraction gratings suchas deep-etched multilayer gratings, and multilayer coated echelettes arediscussed. We also present simulations of diffraction efficiency for suchgratings, and investigate the necessary fabricationtolerances.

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  • Optics and Photonics 2007:Optical Engeneering andapplications Simposium, ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS(OP323), San Diego, CA, August 26-30, 2007

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  • Report No.: LBNL--62515
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 922858
  • Archival Resource Key: ark:/67531/metadc894637

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  • August 21, 2007

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  • Sept. 27, 2016, 1:39 a.m.

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  • Sept. 30, 2016, 2:21 p.m.

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Voronov, Dmitriy L.; Cambie, Rossana; Feshchenko, Ruslan M.; Gullikson, Eric M.; Padmore, Howard A.; Vinogradov, Alexander V. et al. Development of an ultra-high resolution diffraction grating forsoft x-rays, article, August 21, 2007; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc894637/: accessed December 11, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.