Effects of Impurities on Alumina-Niobium InterfacialMicrostructures

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Optical microscopy, scanning electron microscopy, and transmission electron microscopy were employed to examine the interfacial microstructural effects of impurities in alumina substrates used to fabricate alumina-niobium interfaces via liquid-film-assisted joining. Three types of alumina were used: undoped high-purity single-crystal sapphire; a high-purity, high-strength polycrystalline alumina; and a lower-purity, lower-strength polycrystalline alumina. Interfaces formed between niobium and both the sapphire and high-purity polycrystalline alumina were free of detectable levels of impurities. In the lower-purity alumina, niobium silicides were observed at the alumina-niobium interface and on alumina grain boundaries near the interface. These silicides formed in small-grained regions of the alumina and ... continued below

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McKeown, Joseph T.; Sugar, Joshua D.; Gronsky, Ronald & Glaeser,Andreas M. June 20, 2005.

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Optical microscopy, scanning electron microscopy, and transmission electron microscopy were employed to examine the interfacial microstructural effects of impurities in alumina substrates used to fabricate alumina-niobium interfaces via liquid-film-assisted joining. Three types of alumina were used: undoped high-purity single-crystal sapphire; a high-purity, high-strength polycrystalline alumina; and a lower-purity, lower-strength polycrystalline alumina. Interfaces formed between niobium and both the sapphire and high-purity polycrystalline alumina were free of detectable levels of impurities. In the lower-purity alumina, niobium silicides were observed at the alumina-niobium interface and on alumina grain boundaries near the interface. These silicides formed in small-grained regions of the alumina and were found to grow from the interface into the alumina along grain boundaries. Smaller silicide precipitates found on grain boundaries are believed to form upon cooling from the bonding temperature.

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  • Journal Name: Materials Characterization; Journal Volume: 57; Journal Issue: 1; Related Information: Journal Publication Date: 07/2006

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  • Report No.: LBNL--57155
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 919917
  • Archival Resource Key: ark:/67531/metadc894338

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Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • June 20, 2005

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  • Sept. 27, 2016, 1:39 a.m.

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  • Oct. 31, 2016, 3:49 p.m.

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McKeown, Joseph T.; Sugar, Joshua D.; Gronsky, Ronald & Glaeser,Andreas M. Effects of Impurities on Alumina-Niobium InterfacialMicrostructures, article, June 20, 2005; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc894338/: accessed April 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.