Applied Focused Ion Beam Techniques for Sample Preparation of Astromaterials for Integrated Nano-Analysis

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Sample preparation is always a critical step in study of micrometer sized astromaterials available for study in the laboratory, whether their subsequent analysis is by electron microscopy or secondary ion mass spectrometry. A focused beam of gallium ions has been used to prepare electron transparent sections from an interplanetary dust particle, as part of an integrated analysis protocol to maximize the mineralogical, elemental, isotopic and spectroscopic information extracted from one individual particle. In addition, focused ion beam techniques have been employed to extract cometary residue preserved on the rims and walls of micro-craters in 1100 series aluminum foils that were ... continued below

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Graham, G A; Teslich, N E; Kearsley, A T; Stadermann, F J; Stroud, R M; Dai, Z R et al. February 20, 2007.

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Sample preparation is always a critical step in study of micrometer sized astromaterials available for study in the laboratory, whether their subsequent analysis is by electron microscopy or secondary ion mass spectrometry. A focused beam of gallium ions has been used to prepare electron transparent sections from an interplanetary dust particle, as part of an integrated analysis protocol to maximize the mineralogical, elemental, isotopic and spectroscopic information extracted from one individual particle. In addition, focused ion beam techniques have been employed to extract cometary residue preserved on the rims and walls of micro-craters in 1100 series aluminum foils that were wrapped around the sample tray assembly on the Stardust cometary sample collector. Non-ideal surface geometries and inconveniently located regions of interest required creative solutions. These include support pillar construction and relocation of a significant portion of sample to access a region of interest. Serial sectioning, in a manner similar to ultramicrotomy, is a significant development and further demonstrates the unique capabilities of focused ion beam microscopy for sample preparation of astromaterials.

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PDF-file: 30 pages; size: 0.7 Mbytes

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  • Journal Name: Meteoritic and Planetary Science, vol. 43, no. 3, March 1, 2008, pp. 561-569; Journal Volume: 43; Journal Issue: 3

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  • Report No.: UCRL-JRNL-228355
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 940478
  • Archival Resource Key: ark:/67531/metadc893805

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  • February 20, 2007

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  • Sept. 27, 2016, 1:39 a.m.

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  • Nov. 22, 2016, 7:30 p.m.

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Graham, G A; Teslich, N E; Kearsley, A T; Stadermann, F J; Stroud, R M; Dai, Z R et al. Applied Focused Ion Beam Techniques for Sample Preparation of Astromaterials for Integrated Nano-Analysis, article, February 20, 2007; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc893805/: accessed June 24, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.