Direct Laser Ablation and Ionization of Solids for Chemical Analysis by Mass Spectrometry

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A laser ablation/ionization mass spectrometer system is described for the direct chemical analysis of solids. An Nd:YAG laser is used for ablation and ionization of the sample in a quadrupole ion trap operated in an ion-storage (IS) mode that is coupled with a reflectron time-of-flight mass spectrometer (TOF-MS). Single pulse experiments have demonstrated simultaneous detection of up to 14 elements present in glasses in the ppm range. However, detection of the components has produced non-stoichiometric results due to difference in ionization potentials and fractionation effects. Time-of-flight secondary ionization mass spectrometry (TOF-SIMS) was used to spatially map elemental species on the ... continued below

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8 p. (0.2 MB)

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Holt, J K; Nelson, E J & Klunder, G L September 2, 2005.

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Description

A laser ablation/ionization mass spectrometer system is described for the direct chemical analysis of solids. An Nd:YAG laser is used for ablation and ionization of the sample in a quadrupole ion trap operated in an ion-storage (IS) mode that is coupled with a reflectron time-of-flight mass spectrometer (TOF-MS). Single pulse experiments have demonstrated simultaneous detection of up to 14 elements present in glasses in the ppm range. However, detection of the components has produced non-stoichiometric results due to difference in ionization potentials and fractionation effects. Time-of-flight secondary ionization mass spectrometry (TOF-SIMS) was used to spatially map elemental species on the surface and provide further evidence of fractionation effects. Resolution (m/Dm) of 1500 and detection limits of approximately 10 pg have been achieved with a single laser pulse. The system configuration and related operating principles for accurately measuring low concentrations of isotopes are described.

Physical Description

8 p. (0.2 MB)

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PDF-file: 8 pages; size: 0.2 Mbytes

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  • Presented at: Conference on Laser Ablation, Banff, Canada, Sep 12 - Sep 19, 2005

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  • Report No.: UCRL-PROC-215279
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 883533
  • Archival Resource Key: ark:/67531/metadc892091

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • September 2, 2005

Added to The UNT Digital Library

  • Sept. 23, 2016, 2:42 p.m.

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  • April 17, 2017, 2:05 p.m.

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Holt, J K; Nelson, E J & Klunder, G L. Direct Laser Ablation and Ionization of Solids for Chemical Analysis by Mass Spectrometry, article, September 2, 2005; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc892091/: accessed April 26, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.