PICOSECOND-RESOLUTION "SLICE" EMITTANCE MEASUREMENT OF ELECTRON-BUNCHES.

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The Slice Emittance diagnostic is applicable to particle bunches in a linac that are of the order of a few degrees of phase long. In this technique, the transverse phase space of a longitudinal slice about one degree long is measured. The Slice Emittance diagnostic has been demonstrated on an electron bunch produced by a laser-photocathode RF gun. We measured the transverse beam matrix of one picosecond slices out of a 10 picosecond long bunch (about 10 degrees at the RF frequency of 2856 MHz). To implement this diagnostic one needs a phase shifter on part of the linac, a ... continued below

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5 pages

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BEN-ZVI,I.; QIU,J.X. & WANG,X. May 12, 1997.

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The Slice Emittance diagnostic is applicable to particle bunches in a linac that are of the order of a few degrees of phase long. In this technique, the transverse phase space of a longitudinal slice about one degree long is measured. The Slice Emittance diagnostic has been demonstrated on an electron bunch produced by a laser-photocathode RF gun. We measured the transverse beam matrix of one picosecond slices out of a 10 picosecond long bunch (about 10 degrees at the RF frequency of 2856 MHz). To implement this diagnostic one needs a phase shifter on part of the linac, a momentum analyzer (a dipole magnet followed by a slit) and a transverse emittance measuring system following the analyzer. By dephasing the last section (or sections) of the linac, longitudinal position in the bunch is correlated with energy. The momentum analyzer selects a short longitudinal slice by discriminating on energy and the transverse phase space of this slice is measured downstream of the analyzer. The Slice Emittance diagnostic, particularly in conjunction with tomographic analysis of the transverse phase space of the slices, provides significant new information about the 6-D phase space distribution of the beam. The experimental work done with this diagnostic has been used to study the details of the important emittance compensation method that is in wide use in photoinjectors. This diagnostic makes it possible to take the emittance compensation method a step further and apply non-linear emittance compensation for higher brightness beams.

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5 pages

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  • 1997 PARTICLE ACCELERATOR CONFERENCE; VANCOUVER, B.C., CANADA; 19970512 through 19970516

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  • Report No.: BNL--64755
  • Grant Number: DE-AC02-98CH10886
  • Office of Scientific & Technical Information Report Number: 883864
  • Archival Resource Key: ark:/67531/metadc892001

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • May 12, 1997

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  • Sept. 23, 2016, 2:42 p.m.

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  • Jan. 30, 2018, 7:23 p.m.

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BEN-ZVI,I.; QIU,J.X. & WANG,X. PICOSECOND-RESOLUTION "SLICE" EMITTANCE MEASUREMENT OF ELECTRON-BUNCHES., article, May 12, 1997; [Upton, New York]. (digital.library.unt.edu/ark:/67531/metadc892001/: accessed December 14, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.