High resolution trace element and isotopic imaging of microbial systems by NanoSIMS

PDF Version Also Available for Download.

Description

The NanoSIMS 50 is the state of the art in high spatial resolution secondary ion mass spectrometry (SIMS), combining unprecedented spatial resolution (as good as 50 nm) with ultra-high sensitivity (minimum detection limit of {approx}200 atoms). The NanoSIMS has an array of detectors, enabling simultaneous collection of 5 species originating from the same sputtered volume of a sample. The primary ion beam (Cs{sup +} or O{sup -}) can be scanned across the sample to produce quantitative secondary ion images. This capability provides a novel new approach to the study of microbial systems. We have applied our NanoSIMS to various microbial ... continued below

Physical Description

PDF-file: 3 pages; size: 69.8 Kbytes

Creation Information

Weber, P K; Fallon, S J; Pett-Ridge, J; Ghosal, S; Ramon, C E & Hutcheon, I D September 8, 2005.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

The NanoSIMS 50 is the state of the art in high spatial resolution secondary ion mass spectrometry (SIMS), combining unprecedented spatial resolution (as good as 50 nm) with ultra-high sensitivity (minimum detection limit of {approx}200 atoms). The NanoSIMS has an array of detectors, enabling simultaneous collection of 5 species originating from the same sputtered volume of a sample. The primary ion beam (Cs{sup +} or O{sup -}) can be scanned across the sample to produce quantitative secondary ion images. This capability provides a novel new approach to the study of microbial systems. We have applied our NanoSIMS to various microbial systems. We have analyzed sub-regions of bacterial cells, biofilms, and other associated materials to map trace element and isotopic ratios on a submicron scale. Growth and metabolism have been tracked using stable isotope labels. High resolution SIMS is particularly powerful when used in combination with other high resolution techniques, such as FIB and TEM. Examples will be presented to demonstrate the range of capabilities of this technique for microbial systems.

Physical Description

PDF-file: 3 pages; size: 69.8 Kbytes

Source

  • Presented at: AGU Fall Meeting 2005, San Francisco, CA, United States, Dec 05 - Dec 09, 2005

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Report No.: UCRL-CONF-215311
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 917903
  • Archival Resource Key: ark:/67531/metadc890381

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • September 8, 2005

Added to The UNT Digital Library

  • Sept. 22, 2016, 2:13 a.m.

Description Last Updated

  • Nov. 29, 2016, 12:41 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 2

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Weber, P K; Fallon, S J; Pett-Ridge, J; Ghosal, S; Ramon, C E & Hutcheon, I D. High resolution trace element and isotopic imaging of microbial systems by NanoSIMS, article, September 8, 2005; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc890381/: accessed June 19, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.