Reflection Mode Imaging with High Resolution X-rayMicroscopy

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We report on the first demonstration of imaging microstructures with soft x-ray microscopy operating in reflection geometry. X-ray microscopy in reflection mode combines the high resolution available with x-ray optics, the ability to image thick samples, and to directly image surfaces and interfaces. Future experiments with this geometry will include tuning the incident angle to obtain depth resolution. In combination with XMCD as magnetic contrast mechanism this mode will allow studies of deep buried magnetic interfaces.

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Denbeaux, Greg; Fischer, Peter; Salmassi, Farhad; Dunn, Kathleen & Evertsen, James April 2, 2005.

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We report on the first demonstration of imaging microstructures with soft x-ray microscopy operating in reflection geometry. X-ray microscopy in reflection mode combines the high resolution available with x-ray optics, the ability to image thick samples, and to directly image surfaces and interfaces. Future experiments with this geometry will include tuning the incident angle to obtain depth resolution. In combination with XMCD as magnetic contrast mechanism this mode will allow studies of deep buried magnetic interfaces.

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  • The 8th International Conference on X-rayMicroscopy, Egret Himeji, Japan, July 2005

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  • Report No.: LBNL--60976
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 903496
  • Archival Resource Key: ark:/67531/metadc889930

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Office of Scientific & Technical Information Technical Reports

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  • April 2, 2005

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  • Sept. 22, 2016, 2:13 a.m.

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  • Dec. 16, 2016, 1:03 p.m.

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Denbeaux, Greg; Fischer, Peter; Salmassi, Farhad; Dunn, Kathleen & Evertsen, James. Reflection Mode Imaging with High Resolution X-rayMicroscopy, article, April 2, 2005; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc889930/: accessed December 13, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.