Focused ion beam techniques for fabricating geometrically-complex components and devices.

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We have researched several new focused ion beam (FIB) micro-fabrication techniques that offer control of feature shape and the ability to accurately define features onto nonplanar substrates. These FIB-based processes are considered useful for prototyping, reverse engineering, and small-lot manufacturing. Ion beam-based techniques have been developed for defining features in miniature, nonplanar substrates. We demonstrate helices in cylindrical substrates having diameters from 100 {micro}m to 3 mm. Ion beam lathe processes sputter-define 10-{micro}m wide features in cylindrical substrates and tubes. For larger substrates, we combine focused ion beam milling with ultra-precision lathe turning techniques to accurately define 25-100 {micro}m features ... continued below

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71 p.

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Mayer, Thomas Michael; Adams, David Price; Hodges, V. Carter & Vasile, Michael J. March 1, 2004.

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Description

We have researched several new focused ion beam (FIB) micro-fabrication techniques that offer control of feature shape and the ability to accurately define features onto nonplanar substrates. These FIB-based processes are considered useful for prototyping, reverse engineering, and small-lot manufacturing. Ion beam-based techniques have been developed for defining features in miniature, nonplanar substrates. We demonstrate helices in cylindrical substrates having diameters from 100 {micro}m to 3 mm. Ion beam lathe processes sputter-define 10-{micro}m wide features in cylindrical substrates and tubes. For larger substrates, we combine focused ion beam milling with ultra-precision lathe turning techniques to accurately define 25-100 {micro}m features over many meters of path length. In several cases, we combine the feature defining capability of focused ion beam bombardment with additive techniques such as evaporation, sputter deposition and electroplating in order to build geometrically-complex, functionally-simple devices. Damascene methods that fabricate bound, metal microcoils have been developed for cylindrical substrates. Effects of focused ion milling on surface morphology are also highlighted in a study of ion-milled diamond.

Physical Description

71 p.

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  • Report No.: SAND2004-0911
  • Grant Number: AC04-94AL85000
  • DOI: 10.2172/918768 | External Link
  • Office of Scientific & Technical Information Report Number: 918768
  • Archival Resource Key: ark:/67531/metadc889827

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  • March 1, 2004

Added to The UNT Digital Library

  • Sept. 22, 2016, 2:13 a.m.

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  • Nov. 28, 2016, 4:40 p.m.

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Mayer, Thomas Michael; Adams, David Price; Hodges, V. Carter & Vasile, Michael J. Focused ion beam techniques for fabricating geometrically-complex components and devices., report, March 1, 2004; United States. (digital.library.unt.edu/ark:/67531/metadc889827/: accessed December 18, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.