Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry (Presentation)

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The summary of this report is that: in situ SE gives insight into growth mechanisms and accurate layer thickness; (2) ex situ SE measures completed device structures to determine integrated optical properties; and (3) the combination of in situ and ex situ SE provides a powerful method for pinpointing the effects of processing changes in actual SHJ devices and guiding optimization.

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17 p.

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Levi, D.; Iwaniczko, E.; Page, M.; Branz, H. & T., Wang May 1, 2006.

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Description

The summary of this report is that: in situ SE gives insight into growth mechanisms and accurate layer thickness; (2) ex situ SE measures completed device structures to determine integrated optical properties; and (3) the combination of in situ and ex situ SE provides a powerful method for pinpointing the effects of processing changes in actual SHJ devices and guiding optimization.

Physical Description

17 p.

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  • Prepared for the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4), 7-12 May 2006, Waikoloa, Hawaii

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  • Report No.: NREL/PR-520-39986
  • Grant Number: AC36-99-GO10337
  • Office of Scientific & Technical Information Report Number: 894451
  • Archival Resource Key: ark:/67531/metadc888913

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Office of Scientific & Technical Information Technical Reports

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Creation Date

  • May 1, 2006

Added to The UNT Digital Library

  • Sept. 22, 2016, 2:13 a.m.

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  • April 3, 2017, 8:45 p.m.

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Levi, D.; Iwaniczko, E.; Page, M.; Branz, H. & T., Wang. Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry (Presentation), article, May 1, 2006; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc888913/: accessed November 13, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.