Laser Measurement of SAM Bulk and Surface Wave Amplitudes for Material Microstructure Analysis

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Scanning Acoustic Microscopy (SAM) at ultra high frequencies has proven to be a useful tool for investigating materials on the scale of individual grains. This technique is normally performed in a reflection mode from one side of a sample surface. Information about the generation and transmission of bulk acoustic waves into the material is inferred from the reflection signal amplitude. We present an adaptation to the SAM method whereby the acoustic bulk waves are directly visualized through laser acoustic detection. Ultrasonic waves were emitted from a nominal 200 MHz point focus acoustic lens into a thin silicon plate (thickness 75ìm) ... continued below

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Telschow, Ken L.; Miyasaka, Chiaki & Cottle, David L. July 1, 2005.

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Scanning Acoustic Microscopy (SAM) at ultra high frequencies has proven to be a useful tool for investigating materials on the scale of individual grains. This technique is normally performed in a reflection mode from one side of a sample surface. Information about the generation and transmission of bulk acoustic waves into the material is inferred from the reflection signal amplitude. We present an adaptation to the SAM method whereby the acoustic bulk waves are directly visualized through laser acoustic detection. Ultrasonic waves were emitted from a nominal 200 MHz point focus acoustic lens into a thin silicon plate (thickness 75ìm) coupled with distilled water. A scanned laser beam detected the bulk and surface acoustic waves at the opposite surface of the thin silicon plate. Distinct amplitude patterns exhibiting the expected symmetry for Silicon were observed that alter in predictable ways as the acoustic focal point was moved throughout the plate. Predictions of the acoustic wave fields generated by the acoustic lens within and at the surface of the Silicon are being investigated through the angular spectrum of plane waves approach. Results shall be presented for plates with (100) and (111) orientations followed by discussion of applications of the technique for material microstructure analysis.

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  • 22nd Annual Review of Progress in Quantitative Nondestructive Evaluation,Bowdoin College, Brunswick, Maine,07/31/2005,08/05/2005

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  • Report No.: INL/CON-05-00259
  • Grant Number: DE-AC07-99ID-13727
  • Office of Scientific & Technical Information Report Number: 911102
  • Archival Resource Key: ark:/67531/metadc888141

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • July 1, 2005

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  • Sept. 22, 2016, 2:13 a.m.

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  • Dec. 12, 2016, 7:59 p.m.

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Telschow, Ken L.; Miyasaka, Chiaki & Cottle, David L. Laser Measurement of SAM Bulk and Surface Wave Amplitudes for Material Microstructure Analysis, article, July 1, 2005; [Idaho Falls, Idaho]. (digital.library.unt.edu/ark:/67531/metadc888141/: accessed October 18, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.