Flash X-Ray Diffraction System for Fast, Single-PulseTemperature and Phase Transition Measurements (Pre-print)

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A new, fast, single-pulse diagnostic for determining phase transitions and measuring the bulk temperature of polycrystalline metal objects has been developed. The diagnostic consists of a 37-stage Marx bank with a cable-coupled X-ray diode that produces a 35-ns pulse of mostly 0.71-{angstrom} monochromatic X rays and a P-43 fluor coupled to a cooled, charge-coupled device camera by a coherent fiber-optic bundle for detection of scattered X rays. The X-ray beam is collimated to a 1{sup o} divergence in the scattering plane with the combination of a 1.5-mm tungsten pinhole and a 1.5-mm-diameter molybdenum anode. X rays are produced by a ... continued below

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Madlener, Michael J. & Morgan, Dane V. June 12, 2007.

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A new, fast, single-pulse diagnostic for determining phase transitions and measuring the bulk temperature of polycrystalline metal objects has been developed. The diagnostic consists of a 37-stage Marx bank with a cable-coupled X-ray diode that produces a 35-ns pulse of mostly 0.71-{angstrom} monochromatic X rays and a P-43 fluor coupled to a cooled, charge-coupled device camera by a coherent fiber-optic bundle for detection of scattered X rays. The X-ray beam is collimated to a 1{sup o} divergence in the scattering plane with the combination of a 1.5-mm tungsten pinhole and a 1.5-mm-diameter molybdenum anode. X rays are produced by a high-energy electron beam transiting inward from the cathode to the anode in a needle-and-washer configuration. The anode's characteristic K-{alpha} X-ray emission lines are utilized for this diffraction system. The X-ray anode is heavily shielded in all directions other than the collimated beam. The X-ray diode has a sealed reentrant system, allowing X rays to be produced inside a vacuum containment vessel, close to the sample under study.

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  • 2007 IEEE Pulsed Power and Plasma Science Conference Albuquerque, NM June 17-22, 2007

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  • Report No.: DOE/NV/25946--224
  • Grant Number: DE-AC52-0625946
  • Office of Scientific & Technical Information Report Number: 913067
  • Archival Resource Key: ark:/67531/metadc887323

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  • June 12, 2007

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  • Sept. 22, 2016, 2:13 a.m.

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  • Oct. 31, 2016, 8:11 p.m.

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Madlener, Michael J. & Morgan, Dane V. Flash X-Ray Diffraction System for Fast, Single-PulseTemperature and Phase Transition Measurements (Pre-print), article, June 12, 2007; United States. (digital.library.unt.edu/ark:/67531/metadc887323/: accessed October 23, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.