User-Friendly End Station at the ALS for Nanostructure Characterization

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This is a construction project for an end station at the ALS, which is optimized for measuring NEXAFS of nanostructures with fluorescence detection. Compared to the usual electron yield detection, fluorescence is able to probe buried structures and is sensitive to dilute species, such as nanostructures supported on a substrate. Since the quantum yield for fluorescence is 10{sup -4}-10{sup -5} times smaller than for electrons in the soft x-ray regime, such an end station requires bright undulator beamlines at the ALS. In order to optimize the setup for a wide range of applications, two end stations were built: (1) A ... continued below

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Himpsel, F. J.; Alivisatos, P.; Callcott, T.; Carlisle, J.; Denlinger, J. D.; Eastman, D. E. et al. July 5, 2006.

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Description

This is a construction project for an end station at the ALS, which is optimized for measuring NEXAFS of nanostructures with fluorescence detection. Compared to the usual electron yield detection, fluorescence is able to probe buried structures and is sensitive to dilute species, such as nanostructures supported on a substrate. Since the quantum yield for fluorescence is 10{sup -4}-10{sup -5} times smaller than for electrons in the soft x-ray regime, such an end station requires bright undulator beamlines at the ALS. In order to optimize the setup for a wide range of applications, two end stations were built: (1) A simple, mobile chamber with efficient photon detection (>10{sup 4} times the solid angle collection of fluorescence spectrographs) and a built-in magnet for MCD measurements at EPU beamlines (Fig. 1 left). It allows rapid mapping the electronic states of nanostructures (nanocrystals, nanowires, tailored magnetic materials, buried interfaces, biologically-functionalized surfaces). It was used with BL 8.0 (linear polarized undulator) and BL 4.0 (variable polarization). (2) A sophisticated, stationary end station operating at Beamline 8.0 (Fig. 1 right). It contains an array of surface characterization instruments and a micro-focus capability for scanning across graded samples (wedges for thickness variation, stoichiometry gradients, and general variations of the sample preparation conditions for optimizing nanostructures).

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  • Report No.: DOE/ER/45917
  • Grant Number: FG02-01ER45917
  • DOI: 10.2172/896224 | External Link
  • Office of Scientific & Technical Information Report Number: 896224
  • Archival Resource Key: ark:/67531/metadc883643

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  • July 5, 2006

Added to The UNT Digital Library

  • Sept. 22, 2016, 2:13 a.m.

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  • Jan. 8, 2018, 3:19 p.m.

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Himpsel, F. J.; Alivisatos, P.; Callcott, T.; Carlisle, J.; Denlinger, J. D.; Eastman, D. E. et al. User-Friendly End Station at the ALS for Nanostructure Characterization, report, July 5, 2006; Madison, Wisconsin. (digital.library.unt.edu/ark:/67531/metadc883643/: accessed October 15, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.