Enhancing YBCO performance through fundamental process evaluation and characterization Page: 2 of 7
This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided to Digital Library by the UNT Libraries Government Documents Department.
The following text was automatically extracted from the image on this page using optical character recognition software:
The scope of this program has evolved from studying the
fundamental processes that lead to defect formation to incorporation
of suitable defects for enhancing flux pinning properties. Following
are the issues that were addressed:
a) Comparison of YBCO deposition processes including use of
aerosol-assisted deposition (AAD) in developing defect free
b) Establish the relationship between film microstructure, defects,
thickness, YBCO deposition process and critical current density
c) Investigation of feasibility of using laser striation method for
reducing the ac losses in YBCO coated conductors. Study of
relationship between film microstructure, defects, thickness,
YBCO deposition process used and the critical current density
d) Investigation of the influence of metal substrate and multi-layer
buffer layers on the subsequent growth and performance of thick
e) Investigation of growth mechanism of YBCO deposited using
f) Microstructural evaluation of novel buffer layers to develop high
current density YBCO coated conductors.
Work Done: Aerosol assisted deposition technique was developed in house, as
an inexpensive non-vacuum technique for deposition of high density,
thick YBCO films. The film deposition parameters, precursor
composition, heat treatment temperature, PO2 etc. were optimized for
single phase, c-axis oriented film. This process was eventually
abandoned due to major scale up issues.
Microstructural and morphological investigation was performed on
two multi-layered samples comprising of PLD-YBCO/SRO/H-
MgO/ISD-MgO/YSZ/HC (from Argonne National Laboratory- ANL).
The first sample carried l = 8.4 A, Jc=248 KA/cm2 while its sister
sample (deposited during the same run) showed better performance,
i.e ~ 0.9 MA/cm2. The rest of the layers in the film stack were grown
under the same process conditions.
The goal of this study was to delineate the microstructural difference
between the high current carrying region and low current carrying
region as observed from the magneto optical imaging. The
microstructural characterization was performed using Focused Ion
Beam (FIB) and Scanning Electron Microscope with Energy
Dispersive Spectroscopy attachment (SEM-EDS).
Here’s what’s next.
This report can be searched. Note: Results may vary based on the legibility of text within the document.
Tools / Downloads
Get a copy of this page or view the extracted text.
Citing and Sharing
Basic information for referencing this web page. We also provide extended guidance on usage rights, references, copying or embedding.
Reference the current page of this Report.
Haldar, Dr. Pradeep & Daley, Jim. Enhancing YBCO performance through fundamental process evaluation and characterization, report, October 11, 2006; United States. (digital.library.unt.edu/ark:/67531/metadc883091/m1/2/: accessed January 21, 2019), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.