Radiation experience with the CDF silicon detectors

PDF Version Also Available for Download.

Description

The silicon detectors of the CDF experiment at the Tevatron collider are operated in a harsh radiation environment. The lifetime of the silicon detectors is limited by radiation damage, and beam-related incidents are an additional risk. This article describes the impact of beam-related incidents on detector operation and the effects of radiation damage on electronics noise and the silicon sensors. From measurements of the depletion voltage as a function of the integrated luminosity, estimates of the silicon detector lifetime are derived.

Physical Description

4 pages

Creation Information

Husemann, Ulrich & U., /Rochester November 1, 2005.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

The silicon detectors of the CDF experiment at the Tevatron collider are operated in a harsh radiation environment. The lifetime of the silicon detectors is limited by radiation damage, and beam-related incidents are an additional risk. This article describes the impact of beam-related incidents on detector operation and the effects of radiation damage on electronics noise and the silicon sensors. From measurements of the depletion voltage as a function of the integrated luminosity, estimates of the silicon detector lifetime are derived.

Physical Description

4 pages

Source

  • Journal Name: Nucl.Instrum.Meth.A569:65-68,2006; Conference: Presented at VERTEX 2005, Chuzenji Lake, Nikko, Japan, 7-11 Nov 2005

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Report No.: FERMILAB-CONF-05-606-E
  • Grant Number: AC02-76CH03000
  • Office of Scientific & Technical Information Report Number: 892261
  • Archival Resource Key: ark:/67531/metadc881925

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • November 1, 2005

Added to The UNT Digital Library

  • Sept. 21, 2016, 2:29 a.m.

Description Last Updated

  • Dec. 1, 2016, 12:55 p.m.

Usage Statistics

When was this article last used?

Congratulations! It looks like you are the first person to view this item online.

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

Husemann, Ulrich & U., /Rochester. Radiation experience with the CDF silicon detectors, article, November 1, 2005; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc881925/: accessed August 17, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.