ION TRAPPING AND CATHODE BOMBARDMENT BY TRAPPED IONS IN DC PHOTOGUNS.

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DC photoguns are used to produce high-quality, high-intensity electron beams for accelerator driven applications. Ion bombardment is believed to be the major cause of degradation of the photocathode efficiency. Additionally to ions produced in the accelerating cathode-anode gap, the electron beam can ionize the residual gas in the transport line. These ions are trapped transversely within the beam and can drift back to the accelerating gap and contribute to the bombardment rate of the cathode. This paper proposes a method to reduce the flow of ions produced in the beam transport line and drifting back to the cathode-anode gap by ... continued below

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POZDEYEV,E. June 25, 2007.

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DC photoguns are used to produce high-quality, high-intensity electron beams for accelerator driven applications. Ion bombardment is believed to be the major cause of degradation of the photocathode efficiency. Additionally to ions produced in the accelerating cathode-anode gap, the electron beam can ionize the residual gas in the transport line. These ions are trapped transversely within the beam and can drift back to the accelerating gap and contribute to the bombardment rate of the cathode. This paper proposes a method to reduce the flow of ions produced in the beam transport line and drifting back to the cathode-anode gap by introducing a positive potential barrier that repels the trapped ions. The reduced ion bombardment rate and increased life time of photocathodes will reduce the downtime required to service photoinjectors and associated costs.

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  • 22ND PARTICLE ACCELERATOR CONFERENCE; ALBUQUERQUE, NEW MEXICO; 20070625 through 20070629

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  • Report No.: BNL--77546-2007-CP
  • Grant Number: DE-AC02-98CH10886
  • Office of Scientific & Technical Information Report Number: 910418
  • Archival Resource Key: ark:/67531/metadc880333

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Office of Scientific & Technical Information Technical Reports

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  • June 25, 2007

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  • Sept. 22, 2016, 2:13 a.m.

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  • Nov. 1, 2016, 4:59 p.m.

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POZDEYEV,E. ION TRAPPING AND CATHODE BOMBARDMENT BY TRAPPED IONS IN DC PHOTOGUNS., article, June 25, 2007; United States. (digital.library.unt.edu/ark:/67531/metadc880333/: accessed December 15, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.