Characterization of Ti K-alpha radiation resulting from interaction of a highly intense laser pulse with a thin titanium foil

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A first demonstration has recently been made of radiography of implosions using a nonthermal K{alpha} radiation source generated with a high intensity picosecond laser pulse [1]. Absolute source brightness is important in assessing the potential of this diagnostic and we present here measurements and Monte-Carlo simulations of the brightness of the Ti K{alpha} back-lighter source. The experiment was conducted at the Vulcan laser within the Rutherford Appleton Laboratory (RAL) in the UK. A set of radiographs were taken in which a back-lighting source was produced using a 1 ps CPA beam. The beam delivered an average of 49J, within an ... continued below

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King, J A; Key, M H; Chen, C D; Freeman, R R; Phillips, T; Akli, K U et al. June 13, 2005.

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A first demonstration has recently been made of radiography of implosions using a nonthermal K{alpha} radiation source generated with a high intensity picosecond laser pulse [1]. Absolute source brightness is important in assessing the potential of this diagnostic and we present here measurements and Monte-Carlo simulations of the brightness of the Ti K{alpha} back-lighter source. The experiment was conducted at the Vulcan laser within the Rutherford Appleton Laboratory (RAL) in the UK. A set of radiographs were taken in which a back-lighting source was produced using a 1 ps CPA beam. The beam delivered an average of 49J, within an 800 {micro}m by 400 {micro}m elliptical spot, onto a 25 {micro}m thick Ti foil (Figure 1). The first of two instruments used to characterize the K{alpha} source was a spherical Bragg crystal imager (Quartz 20{bar 2}3, 2d of 0.2749 nm, radius of curvature 38 cm, aperture 1.6 cm) used to spatially resolve the emission of the K{alpha} back-lighter [2]. The crystal focused the 4.5 keV K{alpha} photons with 10 mm spatial resolution and 7.9 x magnification onto a cooled, 16-bit, 1'' x 1'', 1024 x 1024 pixel CCD chip. The instrument observation angle was normal to the rear axis of the foil. The 2nd instrument was a single hit CCD spectrometer which was used to measure the absolute K{alpha} yield from the Ti target. The spectrometer consisted of a back-thinned CCD with 2048 x 2048 13.5 {micro}m square pixels and a filter (100 or 150 {micro}m Ti) that placed the chip in the single hit photon regime. The angle of observation was 41{sup o} from the rear surface normal of the Ti foil.

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PDF-file: 6 pages; size: 0.6 Mbytes

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  • Presented at: 32nd EPS Plasma Physics Conference, Tarragona, Spain, Jun 27 - Jul 01, 2005

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  • Report No.: UCRL-CONF-213154
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 877767
  • Archival Resource Key: ark:/67531/metadc880300

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  • June 13, 2005

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  • Sept. 21, 2016, 2:29 a.m.

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  • Nov. 22, 2016, 10:20 p.m.

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King, J A; Key, M H; Chen, C D; Freeman, R R; Phillips, T; Akli, K U et al. Characterization of Ti K-alpha radiation resulting from interaction of a highly intense laser pulse with a thin titanium foil, article, June 13, 2005; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc880300/: accessed December 14, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.