HRTEM Imaging of Atoms at Sub-Angstrom Resolution

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John Cowley and his group at Arizona State University pioneered the use of transmission electron microscopy (TEM) for high-resolution imaging. Images were achieved three decades ago showing the crystal unit cell content at better than 4 Angstrom resolution. This achievement enabled researchers to pinpoint the positions of heavy atom columns within the unit cell. Lighter atoms appear as resolution is improved to sub-Angstrom levels. Currently, advanced microscopes can image the columns of the light atoms (carbon, oxygen, nitrogen) that are present in many complex structures, and even the lithium atoms present in some battery materials. Sub-Angstrom imaging, initially achieved by ... continued below

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O'Keefe, Michael A.; Allard, Lawrence F. & Blom, Douglas A. April 6, 2005.

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John Cowley and his group at Arizona State University pioneered the use of transmission electron microscopy (TEM) for high-resolution imaging. Images were achieved three decades ago showing the crystal unit cell content at better than 4 Angstrom resolution. This achievement enabled researchers to pinpoint the positions of heavy atom columns within the unit cell. Lighter atoms appear as resolution is improved to sub-Angstrom levels. Currently, advanced microscopes can image the columns of the light atoms (carbon, oxygen, nitrogen) that are present in many complex structures, and even the lithium atoms present in some battery materials. Sub-Angstrom imaging, initially achieved by focal-series reconstruction of the specimen exit surface wave, will become common place for next-generation electron microscopes with CS-corrected lenses and monochromated electron beams. Resolution can be quantified in terms of peak separation and inter-peak minimum, but the limits imposed on the attainable resolution by the properties of the micro-scope specimen need to be considered. At extreme resolution the ''size'' of atoms can mean that they will not be resolved even when spaced farther apart than the resolution of the microscope.

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  • Journal Name: Journal of Electron Microscopy; Journal Volume: 54; Journal Issue: 3; Related Information: Journal Publication Date: 2005

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  • Report No.: LBNL--57121
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 878527
  • Archival Resource Key: ark:/67531/metadc879870

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • April 6, 2005

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  • Sept. 21, 2016, 2:29 a.m.

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  • Sept. 29, 2016, 8:37 p.m.

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O'Keefe, Michael A.; Allard, Lawrence F. & Blom, Douglas A. HRTEM Imaging of Atoms at Sub-Angstrom Resolution, article, April 6, 2005; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc879870/: accessed November 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.