Magnetic-Field Sensitive Line Ratios in EUV and Soft X-ray Spectra

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We discovered a class of lines that are sensitive to the strength of the ambient magnetic field, and present a measurement of such a line in Ar IX near 49 {angstrom}. Calculations show that the magnitude of field strengths that can be measured ranges from a few hundred gauss to several tens of kilogauss depending on the particular ion emitting the line.

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Beiersdorfer, P; Scofield, J; Brown, G V; Chen, H; Trabert, E & Lepson, J K April 24, 2006.

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Description

We discovered a class of lines that are sensitive to the strength of the ambient magnetic field, and present a measurement of such a line in Ar IX near 49 {angstrom}. Calculations show that the magnitude of field strengths that can be measured ranges from a few hundred gauss to several tens of kilogauss depending on the particular ion emitting the line.

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PDF-file: 6 pages; size: 0 Kbytes

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  • Presented at: NASA Laboratory Astrophysics Workshop, Las Vegas, NV, United States, Feb 14 - Feb 16, 2006

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  • Report No.: UCRL-PROC-220911
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 895713
  • Archival Resource Key: ark:/67531/metadc878552

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  • April 24, 2006

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  • Sept. 22, 2016, 2:13 a.m.

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  • Dec. 7, 2016, 4:48 p.m.

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Beiersdorfer, P; Scofield, J; Brown, G V; Chen, H; Trabert, E & Lepson, J K. Magnetic-Field Sensitive Line Ratios in EUV and Soft X-ray Spectra, article, April 24, 2006; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc878552/: accessed September 23, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.