High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy

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Three-dimensional diffraction microscopy offers the potential for high-resolution aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Critical issues in obtaining a high-quality image include: (1) Data collection--signal to noise, system stability, dynamic range, automation; (2) Alignment of diffraction patterns with respect to one another; (3) Assembly of the diffraction data into a diffraction volume; and (4) Efficient algorithms for applying phase retrieval techniques to the diffraction volume; (5) Stability of the three-dimensional phase retrieval process; (6) Techniques for determining the object support; and (7) Treatment of missing data, both within the beamstop region and ... continued below

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PDF-file: 3 pages; size: 2.4 Mbytes

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Barty, A June 6, 2005.

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Description

Three-dimensional diffraction microscopy offers the potential for high-resolution aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Critical issues in obtaining a high-quality image include: (1) Data collection--signal to noise, system stability, dynamic range, automation; (2) Alignment of diffraction patterns with respect to one another; (3) Assembly of the diffraction data into a diffraction volume; and (4) Efficient algorithms for applying phase retrieval techniques to the diffraction volume; (5) Stability of the three-dimensional phase retrieval process; (6) Techniques for determining the object support; and (7) Treatment of missing data, both within the beamstop region and elsewhere. They have obtained high-quality 3D reconstructions from X-ray diffraction data alone. This is an important step, as it does not require a low-resolution image to fill in the beamstop region.

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PDF-file: 3 pages; size: 2.4 Mbytes

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  • Presented at: Coherence 2005, Porquerolles, France, Jun 14 - Jun 18, 2005

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  • Report No.: UCRL-CONF-213044
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 877916
  • Archival Resource Key: ark:/67531/metadc878479

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Office of Scientific & Technical Information Technical Reports

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  • June 6, 2005

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  • Sept. 21, 2016, 2:29 a.m.

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  • Nov. 29, 2016, 12:37 p.m.

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Barty, A. High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy, article, June 6, 2005; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc878479/: accessed July 19, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.