Soft-X-ray spectra of highly charged Os, Bi, Th, and U ions in an electron beam ion trap

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Systematic variation of the electron-beam energy in an electron-beam ion trap has been employed to produce soft-X-ray spectra of Os, Bi, Th, and U with highest charge states ranging up to Ni-like ions. Guided by relativistic atomic structure calculations, the strongest lines have been identified with {Delta}n = 0 (n = 4 to n' = 4) transitions in Rb- to Cu-like ions. The rather weak 4p-4d transitions are much less affected by QED contributions than the dominant 4s-4p transitions. Our wavelength measurements consequently provide benchmarks with and (almost) without QED. Because the radiative corrections are not very sensitive to the ... continued below

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Trabert, E.; Beiersdorfer, P.; Fournier, K. B. & Chen, M. H. December 3, 2004.

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Systematic variation of the electron-beam energy in an electron-beam ion trap has been employed to produce soft-X-ray spectra of Os, Bi, Th, and U with highest charge states ranging up to Ni-like ions. Guided by relativistic atomic structure calculations, the strongest lines have been identified with {Delta}n = 0 (n = 4 to n' = 4) transitions in Rb- to Cu-like ions. The rather weak 4p-4d transitions are much less affected by QED contributions than the dominant 4s-4p transitions. Our wavelength measurements consequently provide benchmarks with and (almost) without QED. Because the radiative corrections are not very sensitive to the number of electrons in the valence shell, our data, moreover, provide benchmarks for the evaluation of electron-electron interactions.

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PDF-file: 16 pages; size: 0.3 Mbytes

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  • Journal Name: Published in: Canadian Journal of Physics, vol. 83, no. 7, July 14, 2005, pp. 829-840; Journal Volume: 83; Journal Issue: 7

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  • Report No.: UCRL-JRNL-208760
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 875670
  • Archival Resource Key: ark:/67531/metadc877749

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  • December 3, 2004

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  • Sept. 21, 2016, 2:29 a.m.

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  • Dec. 1, 2016, 10:37 p.m.

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Trabert, E.; Beiersdorfer, P.; Fournier, K. B. & Chen, M. H. Soft-X-ray spectra of highly charged Os, Bi, Th, and U ions in an electron beam ion trap, article, December 3, 2004; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc877749/: accessed August 18, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.