Hardware Testing of the BaBar Drift Chamber Electronics Upgrade (SULI paper)

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The BaBar drift chamber provides position, timing, and dE/dx measurements for charged decay products of the {Upsilon}(4S) resonance at 10.58 GeV. Increasing data collection rates stemming from higher PEP II luminosities and background have highlighted dead time problems in the drift chamber's data acquisition system. A proposed upgrade, called Phase II, aims to solve the problem with the introduction of rewritable, higher-memory firmware in the DAQ front-end electronics that lowers dataflow through the system. After fabrication, the new electronics components were tested to ensure proper function and reliability before installation in the detector. Some tests checked for successful operation of ... continued below

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21 pages

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Littlejohn, Bryce; Coll., /Principia; Chu, Yiwen; /MIT; Wiik, Liv & /SLAC January 4, 2006.

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The BaBar drift chamber provides position, timing, and dE/dx measurements for charged decay products of the {Upsilon}(4S) resonance at 10.58 GeV. Increasing data collection rates stemming from higher PEP II luminosities and background have highlighted dead time problems in the drift chamber's data acquisition system. A proposed upgrade, called Phase II, aims to solve the problem with the introduction of rewritable, higher-memory firmware in the DAQ front-end electronics that lowers dataflow through the system. After fabrication, the new electronics components were tested to ensure proper function and reliability before installation in the detector. Some tests checked for successful operation of individual components, while others operated entire sections of the upgraded system in a mockup drift chamber environment. This paper explains the testing process and presents results regarding performance of the upgrade electronics.

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21 pages

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  • Report No.: SLAC-TN-05-072
  • Grant Number: AC02-76SF00515
  • DOI: 10.2172/877992 | External Link
  • Office of Scientific & Technical Information Report Number: 877992
  • Archival Resource Key: ark:/67531/metadc877634

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  • January 4, 2006

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  • Sept. 21, 2016, 2:29 a.m.

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  • Nov. 28, 2016, 7:39 p.m.

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Littlejohn, Bryce; Coll., /Principia; Chu, Yiwen; /MIT; Wiik, Liv & /SLAC. Hardware Testing of the BaBar Drift Chamber Electronics Upgrade (SULI paper), report, January 4, 2006; [Menlo Park, California]. (digital.library.unt.edu/ark:/67531/metadc877634/: accessed August 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.