Calculating emittance for Gaussian and Non-Gaussian distributions by the method of correlations for slits

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Description

One common way for measuring the emittance of an electron beam is with the slits method. The usual approach for analyzing the data is to calculate an emittance that is a subset of the parent emittance. This paper shows an alternative way by using the method of correlations which ties the parameters derived from the beamlets to the actual parameters of the parent emittance. For parent distributions that are Gaussian, this method yields exact results. For non-Gaussian beam distributions, this method yields an effective emittance that can serve as a yardstick for emittance comparisons.

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27 pages

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Tan, Cheng-Yang & /Fermilab August 1, 2006.

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Description

One common way for measuring the emittance of an electron beam is with the slits method. The usual approach for analyzing the data is to calculate an emittance that is a subset of the parent emittance. This paper shows an alternative way by using the method of correlations which ties the parameters derived from the beamlets to the actual parameters of the parent emittance. For parent distributions that are Gaussian, this method yields exact results. For non-Gaussian beam distributions, this method yields an effective emittance that can serve as a yardstick for emittance comparisons.

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27 pages

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  • Report No.: FERMILAB-TM-2354-AD
  • Grant Number: AC02-76CH03000
  • DOI: 10.2172/892489 | External Link
  • Office of Scientific & Technical Information Report Number: 892489
  • Archival Resource Key: ark:/67531/metadc877019

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  • August 1, 2006

Added to The UNT Digital Library

  • Sept. 21, 2016, 2:29 a.m.

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  • Dec. 6, 2016, 7:37 p.m.

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Tan, Cheng-Yang & /Fermilab. Calculating emittance for Gaussian and Non-Gaussian distributions by the method of correlations for slits, report, August 1, 2006; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc877019/: accessed August 19, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.