Quantum efficiency characterization of back-illuminated CCDs Part2: reflectivity measurements

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The usual quantum efficiency (QE) measurement heavily relies on a calibrated photodiode (PD) and the knowledge of the CCDs gain. Either can introduce significant systematic errors. But reflectivity can also be used to verify QE measurements. 1 - R > QE, where R is the reflectivity, and over a significant wavelength range, 1 - R = QE. An unconventional reflectometer has been developed to make this measurement. R is measured in two steps, using light from the lateral monochromator port via an optical fiber. The beam intensity is measured directly with aPD, then both the PD and CCD are moved ... continued below

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Fabricius, Maximilian H.; Bebek, Chris J.; Groom, Donald E.; Karcher, Armin & Roe, Natalie A. January 19, 2006.

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The usual quantum efficiency (QE) measurement heavily relies on a calibrated photodiode (PD) and the knowledge of the CCDs gain. Either can introduce significant systematic errors. But reflectivity can also be used to verify QE measurements. 1 - R > QE, where R is the reflectivity, and over a significant wavelength range, 1 - R = QE. An unconventional reflectometer has been developed to make this measurement. R is measured in two steps, using light from the lateral monochromator port via an optical fiber. The beam intensity is measured directly with aPD, then both the PD and CCD are moved so that the optical path length is unchanged and the light reflects once from the CCD; the PD current ratio gives R. Unlike traditional schemes this approach makes only one reflection from the CCD surface. Since the reflectivity of the LBNL CCDs might be as low as 2 percent this increases the signal to noise ratio dramatically. The goal is a 1 percent accuracy. We obtain good agreement between 1 - R and the direct QE results.

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  • Electronic Imaging 2006, San Jose, CA, 15 - 19January 2006

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  • Report No.: LBNL--59378
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 893744
  • Archival Resource Key: ark:/67531/metadc875112

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  • January 19, 2006

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  • Sept. 21, 2016, 2:29 a.m.

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  • Sept. 30, 2016, 3:56 p.m.

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Fabricius, Maximilian H.; Bebek, Chris J.; Groom, Donald E.; Karcher, Armin & Roe, Natalie A. Quantum efficiency characterization of back-illuminated CCDs Part2: reflectivity measurements, article, January 19, 2006; (digital.library.unt.edu/ark:/67531/metadc875112/: accessed September 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.