High-resolution ab initio Three-dimensional X-ray Diffraction Microscopy

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Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods ... continued below

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Chapman, H N; Barty, A; Marchesini, S; Noy, A; Cui, C; Howells, M R et al. August 19, 2005.

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Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution using X-ray undulator radiation, and establishes the techniques to be used in atomic-resolution ultrafast imaging at X-ray free-electron laser sources.

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PDF-file: 51 pages; size: 1.1 Mbytes

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  • Journal Name: Journal of the Optical Society of America A; Journal Volume: 23; Journal Issue: 5

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  • Report No.: UCRL-JRNL-214796
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 883620
  • Archival Resource Key: ark:/67531/metadc873683

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  • August 19, 2005

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  • Sept. 21, 2016, 2:29 a.m.

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  • Nov. 29, 2016, 12:37 p.m.

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Chapman, H N; Barty, A; Marchesini, S; Noy, A; Cui, C; Howells, M R et al. High-resolution ab initio Three-dimensional X-ray Diffraction Microscopy, article, August 19, 2005; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc873683/: accessed January 19, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.