Flash X-Ray (FXR) Accelerator Optimization Beam-induced Voltage Simulation and TDR Measurements

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Lawrence Livermore National Laboratory (LLNL) is evaluating design alternatives to improve the voltage regulation in our Flash X-Ray (FXR) accelerator cell and pulse-power system. The goal is to create a more mono-energetic electron beam. When an electron beam crosses the energized gap of an accelerator cell, the electron energy is increased. However, the beam with the associated electromagnetic wave also looses a small amount of energy because of the increased impedance seen across the gap. The beam-induced voltage at the gap is time varying. This creates beam energy variations that we need to understand and control. A high-fidelity computer simulation ... continued below

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PDF-file: 6 pages; size: 1.3 Mbytes

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Ong, M M & Vogtlin, G E May 12, 2005.

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Lawrence Livermore National Laboratory (LLNL) is evaluating design alternatives to improve the voltage regulation in our Flash X-Ray (FXR) accelerator cell and pulse-power system. The goal is to create a more mono-energetic electron beam. When an electron beam crosses the energized gap of an accelerator cell, the electron energy is increased. However, the beam with the associated electromagnetic wave also looses a small amount of energy because of the increased impedance seen across the gap. The beam-induced voltage at the gap is time varying. This creates beam energy variations that we need to understand and control. A high-fidelity computer simulation of the beam and cell interaction has been completed to quantify the time varying induced voltage at the gap. The cell and pulse-power system was characterized using a Time-domain Reflectometry (TDR) measurement technique with a coaxial air-line to drive the cell gap. The beam-induced cell voltage is computed by convoluting the cell impedance with measured beam current. The voltage was checked against other measurements to validate the accuracy.

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PDF-file: 6 pages; size: 1.3 Mbytes

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  • Presented at: IEEE International Pulsed Power Conference 2005, Monterey, CA, United States, Jun 13 - Jun 17, 2005

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  • Report No.: UCRL-PROC-212253
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 877852
  • Archival Resource Key: ark:/67531/metadc873493

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • May 12, 2005

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  • Sept. 21, 2016, 2:29 a.m.

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  • Dec. 5, 2016, 4:14 p.m.

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Ong, M M & Vogtlin, G E. Flash X-Ray (FXR) Accelerator Optimization Beam-induced Voltage Simulation and TDR Measurements, article, May 12, 2005; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc873493/: accessed December 14, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.