Investigations of shot reproducibility for the SMP diode at 4.5 MV.

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Description

In experiments conducted on the RITS-6 accelerator, the SMP diode exhibits sig- ni cant shot-to-shot variability. Speci cally, for identical hardware operated at the same voltage, some shots exhibit a catastrophic drop in diode impedance. A study is underway to identify sources of shot-to-shot variations which correlate with diode impedance collapse. To remove knob emission as a source, only data from a shot series conducted with a 4.5-MV peak voltage are considered. The scope of this report is limited to sources of variability which occur away from the diode, such as power ow emission and trajectory changes, variations in pulsed ... continued below

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36 p.

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Bennett, Nichelle; Crain, Marlon D.; Droemer, Darryl W.; Gignac, Raymond Edward; Lare, Gregory A.; Molina, Isidro et al. November 1, 2013.

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Description

In experiments conducted on the RITS-6 accelerator, the SMP diode exhibits sig- ni cant shot-to-shot variability. Speci cally, for identical hardware operated at the same voltage, some shots exhibit a catastrophic drop in diode impedance. A study is underway to identify sources of shot-to-shot variations which correlate with diode impedance collapse. To remove knob emission as a source, only data from a shot series conducted with a 4.5-MV peak voltage are considered. The scope of this report is limited to sources of variability which occur away from the diode, such as power ow emission and trajectory changes, variations in pulsed power, dustbin and transmission line alignment, and di erent knob shapes. We nd no changes in the transmission line hardware, alignment, or hardware preparation methods which correlate with impedance collapse. However, in classifying good versus poor shots, we nd that there is not a continuous spectrum of diode impedance behavior but that the good and poor shots can be grouped into two distinct impedance pro les. This result forms the basis of a follow-on study focusing on the variability resulting from diode physics. 3

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36 p.

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  • Report No.: SAND2013-9863
  • Grant Number: DE-AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 1121975
  • Archival Resource Key: ark:/67531/metadc871013

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  • November 1, 2013

Added to The UNT Digital Library

  • Sept. 16, 2016, 12:32 a.m.

Description Last Updated

  • Feb. 17, 2017, 5:36 p.m.

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Bennett, Nichelle; Crain, Marlon D.; Droemer, Darryl W.; Gignac, Raymond Edward; Lare, Gregory A.; Molina, Isidro et al. Investigations of shot reproducibility for the SMP diode at 4.5 MV., report, November 1, 2013; United States. (digital.library.unt.edu/ark:/67531/metadc871013/: accessed September 23, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.