Suppression of void formation in nickel by a dynamic trapping mechanism

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The effect of carbon on void formation in high purity nickel under neutron irradiation to four fluences ranging from 4 x 10$sup 18$ to 2 x 10$sup 20$ n/cm$sup 2$ (E greater than 0.1 MeV) at 500$sup 0$C was investigated using transmission electron microscopy. In samples containing up to 84 wt ppM C, cubic voids were observed, and the void size tended to increase with increasing C content, while the void density decreased at much greater rates. Consequently, the associated swelling was seen to be steadily reduced. In samples containing 600 ppM C, void formation was completely suppressed, and an ... continued below

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7 p.

Creation Information

Sorensen, S.M. Jr. & Chen, C.W. January 1, 1975.

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  • Ames Laboratory
    Publisher Info: Ames Lab., Iowa (USA)
    Place of Publication: [Ames,] Iowa

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Description

The effect of carbon on void formation in high purity nickel under neutron irradiation to four fluences ranging from 4 x 10$sup 18$ to 2 x 10$sup 20$ n/cm$sup 2$ (E greater than 0.1 MeV) at 500$sup 0$C was investigated using transmission electron microscopy. In samples containing up to 84 wt ppM C, cubic voids were observed, and the void size tended to increase with increasing C content, while the void density decreased at much greater rates. Consequently, the associated swelling was seen to be steadily reduced. In samples containing 600 ppM C, void formation was completely suppressed, and an irradiation-induced dissolution of graphite precipitates occurred. The suppression of void formation in the irradiated Ni is attributed to an effective trapping mechanism associated with the interstitial C atoms in solution. Quantitative analyses on the size and density of voids reveal that the suppressing effect of C is mainly on void nucleation, not on growth. This trapping mechanism is considered to be dynamic in nature because the traps served by the C atoms can move through the lattice rapidly during irradiation until they are anchored in defect complexes. (auth)

Physical Description

7 p.

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Dep. NTIS

Source

  • International conference on radiation damage in metals, Gatlinburg, Tennessee, USA, 5 Oct 1975

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  • Report No.: CONF-751006--12
  • Grant Number: None
  • Office of Scientific & Technical Information Report Number: 4151140
  • Archival Resource Key: ark:/67531/metadc865848

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • January 1, 1975

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  • Sept. 16, 2016, 12:32 a.m.

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  • Oct. 26, 2017, 7:19 p.m.

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Sorensen, S.M. Jr. & Chen, C.W. Suppression of void formation in nickel by a dynamic trapping mechanism, article, January 1, 1975; [Ames,] Iowa. (digital.library.unt.edu/ark:/67531/metadc865848/: accessed November 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.