Transistorized Trip Circuit for Critical Assemblies

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Description

Abstract: A transistor trip circuit intended for critical assemblies and which provides maximum safety against human error or component failure is described.

Physical Description

22 p., some folded : ill. ; 28 cm.

Creation Information

Wade, E. J. & Davidson, D. S. February 24, 1958.

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  • Main Title: Transistorized Trip Circuit for Critical Assemblies
  • Series Title: AEC research and development report
  • Series Title: Atomic Energy Commission Reports
  • Added Title: KAPL (Series) (Schenectady, New York) Report 1910
  • Added Title: Knolls Atomic Power Laboratory Report 1910
  • Added Title: Atomic Energy Commission Report KAPL-1910

Description

Abstract: A transistor trip circuit intended for critical assemblies and which provides maximum safety against human error or component failure is described.

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22 p., some folded : ill. ; 28 cm.

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  • OCLC: 900202874
  • Report No.: KAPL-1910
  • Grant Number: W-31-109 Eng-52
  • Archival Resource Key: ark:/67531/metadc860765

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Technical Report Archive and Image Library

The Technical Report Archive & Image Library (TRAIL) identifies, acquires, catalogs, digitizes and provides unrestricted access to U.S. government agency technical reports. The mission of TRAIL is to ensure preservation, discoverability, and persistent open access to government technical publications regardless of form or format.

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Creation Date

  • February 24, 1958

Added to The UNT Digital Library

  • Aug. 15, 2016, 10:58 a.m.

Description Last Updated

  • Aug. 17, 2016, 10:56 a.m.

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Wade, E. J. & Davidson, D. S. Transistorized Trip Circuit for Critical Assemblies, report, February 24, 1958; Schenectady, New York. (https://digital.library.unt.edu/ark:/67531/metadc860765/: accessed November 29, 2023), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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