Finite-element analysis of the deformation of thin Mylar films due to measurement forces.

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Significant deformation of thin films occurs when measuring thickness by mechanical means. This source of measurement error can lead to underestimating film thickness if proper corrections are not made. Analytical solutions exist for Hertzian contact deformation, but these solutions assume relatively large geometries. If the film being measured is thin, the analytical Hertzian assumptions are not appropriate. ANSYS is used to model the contact deformation of a 48 gauge Mylar film under bearing load, supported by a stiffer material. Simulation results are presented and compared to other correction estimates. Ideal, semi-infinite, and constrained properties of the film and the measurement ... continued below

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43 p.

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Baker, Michael Sean; Robinson, Alex Lockwood & Tran, Hy D. January 1, 2012.

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Description

Significant deformation of thin films occurs when measuring thickness by mechanical means. This source of measurement error can lead to underestimating film thickness if proper corrections are not made. Analytical solutions exist for Hertzian contact deformation, but these solutions assume relatively large geometries. If the film being measured is thin, the analytical Hertzian assumptions are not appropriate. ANSYS is used to model the contact deformation of a 48 gauge Mylar film under bearing load, supported by a stiffer material. Simulation results are presented and compared to other correction estimates. Ideal, semi-infinite, and constrained properties of the film and the measurement tools are considered.

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43 p.

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  • Report No.: SAND2012-0186
  • Grant Number: AC04-94AL85000
  • DOI: 10.2172/1034880 | External Link
  • Office of Scientific & Technical Information Report Number: 1034880
  • Archival Resource Key: ark:/67531/metadc846348

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • January 1, 2012

Added to The UNT Digital Library

  • May 19, 2016, 3:16 p.m.

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  • Nov. 28, 2016, 4:24 p.m.

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Baker, Michael Sean; Robinson, Alex Lockwood & Tran, Hy D. Finite-element analysis of the deformation of thin Mylar films due to measurement forces., report, January 1, 2012; United States. (digital.library.unt.edu/ark:/67531/metadc846348/: accessed October 19, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.