Comparison of Accelerated Testing with Modeling to Predict Lifetime of CPV Solder Layers (Presentation)

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Description

Concentrating photovoltaic (CPV) cell assemblies can fail due to thermomechanical fatigue in the die-attach layer. In this presentation, we show the latest results from our computational model of thermomechanical fatigue. The model is used to estimate the relative lifetime of cell assemblies exposed to various temperature histories consistent with service and with accelerated testing. We also present early results from thermal cycling experiments designed to help validate the computational model.

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40 p.

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Silverman, T. J.; Bosco, N. & Kurtz, S. March 1, 2012.

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Description

Concentrating photovoltaic (CPV) cell assemblies can fail due to thermomechanical fatigue in the die-attach layer. In this presentation, we show the latest results from our computational model of thermomechanical fatigue. The model is used to estimate the relative lifetime of cell assemblies exposed to various temperature histories consistent with service and with accelerated testing. We also present early results from thermal cycling experiments designed to help validate the computational model.

Physical Description

40 p.

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  • Presented at the PV Module Reliability Workshop, 28 February - 2 March 2012, Golden, Colorado; Related Information: NREL (National Renewable Energy Laboratory)

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  • Report No.: NREL/PR-5200-54677
  • Grant Number: AC36-08GO28308
  • Office of Scientific & Technical Information Report Number: 1037929
  • Archival Resource Key: ark:/67531/metadc845953

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  • March 1, 2012

Added to The UNT Digital Library

  • May 19, 2016, 3:16 p.m.

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  • April 6, 2017, 3:36 p.m.

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Silverman, T. J.; Bosco, N. & Kurtz, S. Comparison of Accelerated Testing with Modeling to Predict Lifetime of CPV Solder Layers (Presentation), article, March 1, 2012; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc845953/: accessed August 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.