ANALYZING SURFACE ROUGHNESS DEPENDENCE OF LINEAR RF LOSSES

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Topographic structure on Superconductivity Radio Frequency (SRF) surfaces can contribute additional cavity RF losses describable in terms of surface RF reflectivity and absorption indices of wave scattering theory. At isotropic homogeneous extent, Power Spectrum Density (PSD) of roughness is introduced and quantifies the random surface topographic structure. PSD obtained from different surface treatments of niobium, such Buffered Chemical Polishing (BCP), Electropolishing (EP), Nano-Mechanical Polishing (NMP) and Barrel Centrifugal Polishing (CBP) are compared. A perturbation model is utilized to calculate the additional rough surface RF losses based on PSD statistical analysis. This model will not consider that superconductor becomes normal conducting ... continued below

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Reece, Charles E.; Kelley, Michael J. & Xu, Chen September 1, 2012.

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Topographic structure on Superconductivity Radio Frequency (SRF) surfaces can contribute additional cavity RF losses describable in terms of surface RF reflectivity and absorption indices of wave scattering theory. At isotropic homogeneous extent, Power Spectrum Density (PSD) of roughness is introduced and quantifies the random surface topographic structure. PSD obtained from different surface treatments of niobium, such Buffered Chemical Polishing (BCP), Electropolishing (EP), Nano-Mechanical Polishing (NMP) and Barrel Centrifugal Polishing (CBP) are compared. A perturbation model is utilized to calculate the additional rough surface RF losses based on PSD statistical analysis. This model will not consider that superconductor becomes normal conducting at fields higher than transition field. One can calculate the RF power dissipation ratio between rough surface and ideal smooth surface within this field range from linear loss mechanisms.

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  • LINAC12, 9-14 September 2012, Tel Aviv, Israel

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  • Report No.: JLAB-ACC-12-1699
  • Report No.: DOE/OR/23177-2533
  • Grant Number: AC05-06OR23177
  • Office of Scientific & Technical Information Report Number: 1088989
  • Archival Resource Key: ark:/67531/metadc841044

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  • September 1, 2012

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  • May 19, 2016, 9:45 a.m.

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  • June 20, 2016, 1:05 p.m.

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Reece, Charles E.; Kelley, Michael J. & Xu, Chen. ANALYZING SURFACE ROUGHNESS DEPENDENCE OF LINEAR RF LOSSES, article, September 1, 2012; Newport News, Virginia. (digital.library.unt.edu/ark:/67531/metadc841044/: accessed October 18, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.