A Comprehensive Study of Nanometer Resolution of the IPBPM at ATF2

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High-resolution beam position monitors (IPBPMs) have been developed in order to measure the electron beam position at the focus point of ATF2 to a few nanometers in the vertical plane. To date, the IPBPM system has operated in test mode with a highest demonstrated resolution of 8.7 nm in the ATF extraction line during 2008. After expected noise source calculations there still remains 7.9 nm of noise of unexplained origin. We summarize the experimental work on the IPBPM system since this measurement and outline the possible origins of these sources. We then present a study plan to be performed at ... continued below

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3 pages

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Kim, Y.I.; Park, H.; U., /Kyungpook Natl.; Boogert, S.T.; /Oxford U., JAI; Frisch, J. et al. December 13, 2011.

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High-resolution beam position monitors (IPBPMs) have been developed in order to measure the electron beam position at the focus point of ATF2 to a few nanometers in the vertical plane. To date, the IPBPM system has operated in test mode with a highest demonstrated resolution of 8.7 nm in the ATF extraction line during 2008. After expected noise source calculations there still remains 7.9 nm of noise of unexplained origin. We summarize the experimental work on the IPBPM system since this measurement and outline the possible origins of these sources. We then present a study plan to be performed at the ATF2 facility designed to identify and to improve the resolution performance and comment on the expected ultimate resolution of this system. The Accelerator Test Facility 2 (ATF2) is a test beamline for ILC final focus system in the framework of the ATF international collaboration which was constructed to extend the extraction line at ATF, located at KEK, Japan. There are two goals of the ATF2: firstly to demonstrate focusing to 37 nm vertical beam size, secondly to achieve a few nanometer level beam orbit stability at the focus point in the vertical plane. High-resolution beam position monitors (IPBPMs) for the interaction point (IP) have been developed in order to measure the electron beam position at the focus point of the ATF2 to a few nanometers in the vertical plane. The previous measured position resolution of IPBPMs was 8.7 nm for a 0.68 x 10{sup 10} e/bunch beam with a dynamic range of 5 {mu}m. The intrinsic noise of the system was estimated to be 2.6 nm at 10{sup 10} e/bunch. It is scaled to 3.8 nm at 0.68 x 10{sup 10} e/bunch which means that 7.9 nm of unknown noise remains. The origin of the unknown noise must be studied in order to improve the resolution. This paper describes the ongoing work to improve the resolution of IPBPMs.

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3 pages

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  • Contributed to 2nd International Particle Accelerator Conference: IPAC 2011, San Sebastian, Spain, 4-9 Sep 2011

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  • Report No.: SLAC-PUB-14565
  • Grant Number: AC02-76SF00515
  • Office of Scientific & Technical Information Report Number: 1032765
  • Archival Resource Key: ark:/67531/metadc840302

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  • December 13, 2011

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  • May 19, 2016, 3:16 p.m.

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  • Dec. 9, 2016, 9:11 p.m.

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Kim, Y.I.; Park, H.; U., /Kyungpook Natl.; Boogert, S.T.; /Oxford U., JAI; Frisch, J. et al. A Comprehensive Study of Nanometer Resolution of the IPBPM at ATF2, article, December 13, 2011; United States. (digital.library.unt.edu/ark:/67531/metadc840302/: accessed November 13, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.