Reliability Testing Beyond Qualification as a Key Component in Photovoltaic's Progress Toward Grid Parity: Preprint

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This paper discusses why it is necessary for new lower cost PV modules to be tested using a reliability test sequence that goes beyond the Qualification test sequence now utilized for modules. Today most PV modules are warranted for 25 years, but the Qualification Test Sequence does not test for 25-year life. There is no accepted test protocol to validate a 25-year lifetime. This paper recommends the use of long term accelerated testing to compare now designs directly with older designs that have achieved long lifetimes in outdoor exposure. If the new designs do as well or better than the ... continued below

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9 p.

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Wohlgemuth, J. H. & Kurtz, S. February 1, 2011.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

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Description

This paper discusses why it is necessary for new lower cost PV modules to be tested using a reliability test sequence that goes beyond the Qualification test sequence now utilized for modules. Today most PV modules are warranted for 25 years, but the Qualification Test Sequence does not test for 25-year life. There is no accepted test protocol to validate a 25-year lifetime. This paper recommends the use of long term accelerated testing to compare now designs directly with older designs that have achieved long lifetimes in outdoor exposure. If the new designs do as well or better than the older ones, then it is likely that they will survive an equivalent length of time in the field.

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9 p.

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  • To be presented at the IEEE International Reliability Physics Symposium, 10-14 April 2011, Monterey, California

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  • Report No.: NREL/CP-5200-50599
  • Grant Number: AC36-08GO28308
  • Office of Scientific & Technical Information Report Number: 1006252
  • Archival Resource Key: ark:/67531/metadc838004

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  • February 1, 2011

Added to The UNT Digital Library

  • May 19, 2016, 3:16 p.m.

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  • April 6, 2017, 3:27 p.m.

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Wohlgemuth, J. H. & Kurtz, S. Reliability Testing Beyond Qualification as a Key Component in Photovoltaic's Progress Toward Grid Parity: Preprint, article, February 1, 2011; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc838004/: accessed August 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.