Electrical and thermal finite element modeling of arc faults in photovoltaic bypass diodes. Page: 3 of 33
This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided to UNT Digital Library by the UNT Libraries Government Documents Department.
Extracted Text
The following text was automatically extracted from the image on this page using optical character recognition software:
SAND2012-0743
Unlimited Release
Printed January 2012
Electrical and Thermal Finite Element Modeling
of Arc Faults in Photovoltaic Bypass Diodes
Jay Johnson, Ward Bower, and Michael Quintana
Sandia National Laboratories
P.O. Box 5800
Albuquerque, New Mexico 87185-0352
Abstract
Arc faults in photovoltaic (PV) modules have caused multiple rooftop fires. The arc generates a
high-temperature plasma that ignites surrounding materials and subsequently spreads the fire to
the building structure. While there are many possible locations in PV systems and PV modules
where arcs could initiate, bypass diodes have been suspected of triggering arc faults in some
modules. In order to understand the electrical and thermal phenomena associated with these
events, a finite element model of a busbar and diode was created. Thermoelectrical simulations
found Joule and internal diode heating from normal operation would not normally cause bypass
diode or solder failures. However, if corrosion increased the contact resistance in the solder
connection between the busbar and the diode leads, enough voltage potential would be
established to arc across micron-scale electrode gaps. Lastly, an analytical arc radiation model
based on observed data was employed to predicted polymer ignition times. The model predicted
polymer materials in the adjacent area of the diode and junction box ignite in less than 0.1
seconds.3
Upcoming Pages
Here’s what’s next.
Search Inside
This report can be searched. Note: Results may vary based on the legibility of text within the document.
Tools / Downloads
Get a copy of this page or view the extracted text.
Citing and Sharing
Basic information for referencing this web page. We also provide extended guidance on usage rights, references, copying or embedding.
Reference the current page of this Report.
Bower, Ward Isaac; Quintana, Michael A. & Johnson, Jay. Electrical and thermal finite element modeling of arc faults in photovoltaic bypass diodes., report, January 1, 2012; United States. (https://digital.library.unt.edu/ark:/67531/metadc837768/m1/3/: accessed April 23, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.