D0 Silicon Upgrade: Thermally Induced Stresses in the Components of a D0 Ladder in the Silicon Tracker
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D0 Silicon Upgrade: Thermally Induced Stresses in the Components of a D0 Ladder in the Silicon Tracker, report, July 2, 1996; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc833881/: accessed April 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.