Optical Sideband Generation: a Longitudinal Electron Beam Diagnostic Beyond the Laser Bandwidth Resolution Limit

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Electro-optic sampling (EOS) is widely used as a technique to measure THz-domain electric field pulses such asthe self-fields of femtosecond electron beams. We present an EOS-based approach for single-shot spectral measurement that excels in simplicity (compatible with fiber integration) and bandwidth coverage (overcomes the laser bandwidth limitation), allowing few-fs electron beams or single-cycle THz pulses to be characterized with conventional picosecond probes. It is shown that the EOS-induced optical sidebands on the narrow-bandwidth optical probe are spectrally-shifted replicas of the THz pulse. An experimental demonstration on a 0-3 THz source is presented.

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Laboratory, Lawrence Berkeley National; Tilborg, J. van; Matlis, N. H.; Plateau, G. R. & Leemans, W. P. June 1, 2010.

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Electro-optic sampling (EOS) is widely used as a technique to measure THz-domain electric field pulses such asthe self-fields of femtosecond electron beams. We present an EOS-based approach for single-shot spectral measurement that excels in simplicity (compatible with fiber integration) and bandwidth coverage (overcomes the laser bandwidth limitation), allowing few-fs electron beams or single-cycle THz pulses to be characterized with conventional picosecond probes. It is shown that the EOS-induced optical sidebands on the narrow-bandwidth optical probe are spectrally-shifted replicas of the THz pulse. An experimental demonstration on a 0-3 THz source is presented.

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  • 2010 Advanced Accelerator Concepts Workshop, Annapolis, MD, June 13 - 19, 2010

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  • Report No.: LBNL-4645E
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 1022733
  • Archival Resource Key: ark:/67531/metadc833340

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  • June 1, 2010

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  • May 19, 2016, 3:16 p.m.

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  • June 16, 2016, 12:52 p.m.

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Laboratory, Lawrence Berkeley National; Tilborg, J. van; Matlis, N. H.; Plateau, G. R. & Leemans, W. P. Optical Sideband Generation: a Longitudinal Electron Beam Diagnostic Beyond the Laser Bandwidth Resolution Limit, article, June 1, 2010; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc833340/: accessed November 23, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.