Using Accelerated Testing To Predict Module Reliability: Preprint

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Long-term reliability is critical to the cost effectiveness and commercial success of photovoltaic (PV) products. Today most PV modules are warranted for 25 years, but there is no accepted test protocol to validate a 25-year lifetime. The qualification tests do an excellent job of identifying design, materials, and process flaws that are likely to lead to premature failure (infant mortality), but they are not designed to test for wear-out mechanisms that limit lifetime. This paper presents a method for evaluating the ability of a new PV module technology to survive long-term exposure to specific stresses. The authors propose the use ... continued below

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7 p.

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Wohlgemuth, J. H. & Kurtz, S. July 1, 2011.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 18 times . More information about this article can be viewed below.

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Long-term reliability is critical to the cost effectiveness and commercial success of photovoltaic (PV) products. Today most PV modules are warranted for 25 years, but there is no accepted test protocol to validate a 25-year lifetime. The qualification tests do an excellent job of identifying design, materials, and process flaws that are likely to lead to premature failure (infant mortality), but they are not designed to test for wear-out mechanisms that limit lifetime. This paper presents a method for evaluating the ability of a new PV module technology to survive long-term exposure to specific stresses. The authors propose the use of baseline technologies with proven long-term field performance as controls in the accelerated stress tests. The performance of new-technology modules can then be evaluated versus that of proven-technology modules. If the new-technology demonstrates equivalent or superior performance to the proven one, there is a high likelihood that they will survive versus the tested stress in the real world.

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7 p.

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  • Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), 19-24 June 2011, Seattle, Washington

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  • Report No.: NREL/CP-5200-50646
  • Grant Number: AC36-08GO28308
  • Office of Scientific & Technical Information Report Number: 1022294
  • Archival Resource Key: ark:/67531/metadc831969

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  • July 1, 2011

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  • May 19, 2016, 3:16 p.m.

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  • April 6, 2017, 1:17 p.m.

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Wohlgemuth, J. H. & Kurtz, S. Using Accelerated Testing To Predict Module Reliability: Preprint, article, July 1, 2011; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc831969/: accessed September 23, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.