Characterization of Si Nanostructured Surfaces

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Surface texturing of Si to enhance absorption particularly in the IR spectral region has been extensively investigated. Previous research chiefly examined approaches based on geometrical optics. These surface textures typically consist of pyramids with dimensions much larger than optical wavelengths. We have investigated a physical optics approach that relies on surface texture features comparable to, or smaller than, the optical wavelengths inside the semiconductor material. Light interaction at this are strongly dependent on incident polarization and surface profile. Nanoscale textures can be tuned for either narrow band, or broad band absorptive behavior. Lowest broadband reflection has been observed for triangular ... continued below

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9 p.

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Brueck, S.R.J.; Gee, James M.; Ruby, Douglas S. & Zaidi, Saleem H. July 20, 1999.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM, and Livermore, CA (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

Surface texturing of Si to enhance absorption particularly in the IR spectral region has been extensively investigated. Previous research chiefly examined approaches based on geometrical optics. These surface textures typically consist of pyramids with dimensions much larger than optical wavelengths. We have investigated a physical optics approach that relies on surface texture features comparable to, or smaller than, the optical wavelengths inside the semiconductor material. Light interaction at this are strongly dependent on incident polarization and surface profile. Nanoscale textures can be tuned for either narrow band, or broad band absorptive behavior. Lowest broadband reflection has been observed for triangular profiles with linewidths significantly less than 100 nm. Si nanostructures have been integrated into large ({approximately}42 cm{sup 2}) area solar cells, Internal quantum efficiency measurements in comparison with polished and conventionally textured cells show lower efficiency in the UV-visible (350-680 mu), but significantly higher IR (700-1200 nm) efficiency.

Physical Description

9 p.

Notes

OSTI as DE00009628

Medium: P; Size: 9 pages

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  • SPIE's 44th Annual Meeting and Exhibition, Denver, CO (US), 07/18/1999--07/23/1999

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  • Report No.: SAND99-1897C
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 9628
  • Archival Resource Key: ark:/67531/metadc793566

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  • July 20, 1999

Added to The UNT Digital Library

  • Dec. 19, 2015, 7:14 p.m.

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  • April 11, 2017, 7:31 p.m.

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Brueck, S.R.J.; Gee, James M.; Ruby, Douglas S. & Zaidi, Saleem H. Characterization of Si Nanostructured Surfaces, article, July 20, 1999; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc793566/: accessed September 23, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.