A monolithic constant-fraction discriminator using distributed R-C delay-line shaping

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Description

A monolithic, CMOS, constant-fraction discriminator (CFD) was fabricated in the Orbit Semiconductor, 1.2 {mu} N-well process. This circuit uses an on-chip, distributed, R-C delay-line to realize the constant-fraction shaping. The delay-line is constructed from a narrow, 500-{mu} serpentine layer of polysilicon above a wide, grounded, second layer of polysilicon. This R-C delay-line generates about 1.1 ns of delay for 5 ns risetime signals with a slope degradation of only {approx_equal} 15% and an amplitude reduction of about 6.1%. The CFD also features an automatic walk adjustment. The entire circuit, including the delay line, has a 200 {mu} pitch and is ... continued below

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4 p.

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Simpson, M.L.; Young, G.R. & Xu, M. June 1, 1995.

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Description

A monolithic, CMOS, constant-fraction discriminator (CFD) was fabricated in the Orbit Semiconductor, 1.2 {mu} N-well process. This circuit uses an on-chip, distributed, R-C delay-line to realize the constant-fraction shaping. The delay-line is constructed from a narrow, 500-{mu} serpentine layer of polysilicon above a wide, grounded, second layer of polysilicon. This R-C delay-line generates about 1.1 ns of delay for 5 ns risetime signals with a slope degradation of only {approx_equal} 15% and an amplitude reduction of about 6.1%. The CFD also features an automatic walk adjustment. The entire circuit, including the delay line, has a 200 {mu} pitch and is 950 {mu} long. The walk for a 5 ns risetime signal was measured as {plus_minus} 100 ps over the 100:1 dynamic range from {minus}15 mV to {minus}1.5 mV. to {minus}1.5 V. The CFD consumes 15 mW.

Physical Description

4 p.

Notes

INIS; OSTI as DE95012876

Source

  • IEEE nuclear science symposium and medical imaging conference, San Francisco, CA (United States), 21-28 Oct 1995

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  • Other: DE95012876
  • Report No.: CONF-951073--3
  • Grant Number: AC05-84OR21400
  • Office of Scientific & Technical Information Report Number: 91883
  • Archival Resource Key: ark:/67531/metadc793102

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  • June 1, 1995

Added to The UNT Digital Library

  • Dec. 19, 2015, 7:14 p.m.

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  • Jan. 19, 2016, 8:21 p.m.

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Simpson, M.L.; Young, G.R. & Xu, M. A monolithic constant-fraction discriminator using distributed R-C delay-line shaping, article, June 1, 1995; Tennessee. (digital.library.unt.edu/ark:/67531/metadc793102/: accessed September 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.