Crystal structure dependence of antiferromagnetic coupling in Fe/Si multilayers

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Recent reports of temperature dependent antiferromagnetic coupling in Fe/Si multilayers have motivated the generalization of models describing magnetic coupling in metal/metal multilayers to metal/insulator and metal/semiconductor layered systems. Interesting dependence of the magnetic properties on layer thickness and temperature are predicted. We report measurements that show the antiferromagnetic (AF) coupling observed in Fe/Si multilayers is strongly dependent on the crystalline coherence of the silicide interlayer. Electron diffraction images show the silicide interlayer has a CsCl structure. It is not clear at this time whether the interlayer is a poor metallic conductor or a semiconductor so the relevance of generalized coupling ... continued below

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8 p.

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Michel, R.P.; Chaiken, A. & Wall, M.A. April 1, 1995.

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Description

Recent reports of temperature dependent antiferromagnetic coupling in Fe/Si multilayers have motivated the generalization of models describing magnetic coupling in metal/metal multilayers to metal/insulator and metal/semiconductor layered systems. Interesting dependence of the magnetic properties on layer thickness and temperature are predicted. We report measurements that show the antiferromagnetic (AF) coupling observed in Fe/Si multilayers is strongly dependent on the crystalline coherence of the silicide interlayer. Electron diffraction images show the silicide interlayer has a CsCl structure. It is not clear at this time whether the interlayer is a poor metallic conductor or a semiconductor so the relevance of generalized coupling theories is unclear.

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8 p.

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OSTI as DE95015888

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  • Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 17-21 Apr 1995

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  • Other: DE95015888
  • Report No.: UCRL-JC--120161
  • Report No.: CONF-950412--36
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 93606
  • Archival Resource Key: ark:/67531/metadc792049

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • April 1, 1995

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  • Dec. 19, 2015, 7:14 p.m.

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  • Feb. 16, 2016, 6:12 p.m.

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Michel, R.P.; Chaiken, A. & Wall, M.A. Crystal structure dependence of antiferromagnetic coupling in Fe/Si multilayers, article, April 1, 1995; California. (digital.library.unt.edu/ark:/67531/metadc792049/: accessed December 14, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.