Post-radiation memory correction using differential subtraction for Phenix

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In colliders such as RHIC, the radiation levels are well below those of colliders such as LHC. The problem is that there can be enough radiation at the inner detector (Multiplicity-Vertex Detector or MVD) to significantly affect a low-priced, nonradiation-hard CMOS process. If the radiation affects the entire analog memory in a uniform fashion, then a real-time correction should be able to be performed to correct any changes seen in the memory and also the induced correlated noise from detector pickup thus precluding the need for a more expensive rad-hard process. This paper will present testing on memories fabricated in ... continued below

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4 p.

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Britton, C.L. Jr.; Wintenberg, A.L.; Womac, M.; Kennedy, E.J.; Smith, R.S.; Young, G.R. et al. June 1, 1995.

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In colliders such as RHIC, the radiation levels are well below those of colliders such as LHC. The problem is that there can be enough radiation at the inner detector (Multiplicity-Vertex Detector or MVD) to significantly affect a low-priced, nonradiation-hard CMOS process. If the radiation affects the entire analog memory in a uniform fashion, then a real-time correction should be able to be performed to correct any changes seen in the memory and also the induced correlated noise from detector pickup thus precluding the need for a more expensive rad-hard process. This paper will present testing on memories fabricated in a `soft` process and exposed to ionizing radiation. We used a single pipeline as a reference to be subtracted in a cell-by-cell basis from each pipe during read out and investigated the spatial effects of using different pipes for the reference. Use of this method reduced the noise which was common to all pipes (common-mode noise) and thus reduced both common-mode input noise and pattern noise generated from address lines being exercised on the AMU. The correlation across the memories (6-, 8-, and 16-channel AMUs fabricated in the Orbit 1.2{mu} CMOS process) vs. radiation dose was found to be quite good. Both pre-and post-radiation results are presented on systems designed for PHENIX and WA98 at CERN as well as measured results on the minimization of the effects of injected systematic noise.

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4 p.

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INIS; OSTI as DE95012878

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  • IEEE nuclear science symposium and medical imaging conference, San Francisco, CA (United States), 21-28 Oct 1995

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  • Other: DE95012878
  • Report No.: CONF-951073--4
  • Grant Number: AC05-84OR21400
  • Office of Scientific & Technical Information Report Number: 90088
  • Archival Resource Key: ark:/67531/metadc791793

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Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • June 1, 1995

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  • Dec. 19, 2015, 7:14 p.m.

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  • Feb. 1, 2016, 1:15 p.m.

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Britton, C.L. Jr.; Wintenberg, A.L.; Womac, M.; Kennedy, E.J.; Smith, R.S.; Young, G.R. et al. Post-radiation memory correction using differential subtraction for Phenix, article, June 1, 1995; Tennessee. (digital.library.unt.edu/ark:/67531/metadc791793/: accessed October 18, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.