Determination of the Built-in Electric Field near Contacts to Polycrystalline CuInSe{sub 2} - Probing Local Charge Transport Properties by Photomixing

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The built-in electric field in polycrystalline CuInSe{sub 2} (CIS) near gold co-planar contacts was quantitatively revealed for the first time by the photomixing technique. A He-Ne laser beam was focused locally on the CIS sample near one of its contact. While both dc dark and photo-currents showed ohmic behavior, the high frequency ac current was non-zero for zero applied dc bias, which reveals a built-in electric field of {approx}1000V/cm. The capability of the photomixing technique to probe local charge transport properties is expected to be very useful for, e.g., the quantitative evaluation of the quality of ohmic contacts and the ... continued below

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7 pages

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Tang, Y.; Dong, S.; Sun, G. S.; Braunstein, R. & von Roedern, B. November 19, 1998.

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  • Tang, Y. Princeton Electronic Systems, Inc.
  • Dong, S. Department of Physics, University of California
  • Sun, G. S. Department of Physics, University of California
  • Braunstein, R. Department of Physics, University of California
  • von Roedern, B. National Renewable Energy Laboratory

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The built-in electric field in polycrystalline CuInSe{sub 2} (CIS) near gold co-planar contacts was quantitatively revealed for the first time by the photomixing technique. A He-Ne laser beam was focused locally on the CIS sample near one of its contact. While both dc dark and photo-currents showed ohmic behavior, the high frequency ac current was non-zero for zero applied dc bias, which reveals a built-in electric field of {approx}1000V/cm. The capability of the photomixing technique to probe local charge transport properties is expected to be very useful for, e.g., the quantitative evaluation of the quality of ohmic contacts and the investigation of electric field induced p-n junction formation in CIS and related materials.

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7 pages

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  • Presented at the National Center for Photovoltaics Program Review Meeting, Denver, CO (US), 09/08/1998--09/11/1998

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  • Other: DE00009537
  • Report No.: NREL/CP-520-25517
  • Grant Number: AC36-83CH10093
  • Office of Scientific & Technical Information Report Number: 9537
  • Archival Resource Key: ark:/67531/metadc791708

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  • November 19, 1998

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  • Dec. 19, 2015, 7:14 p.m.

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  • July 13, 2017, 11:54 a.m.

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Tang, Y.; Dong, S.; Sun, G. S.; Braunstein, R. & von Roedern, B. Determination of the Built-in Electric Field near Contacts to Polycrystalline CuInSe{sub 2} - Probing Local Charge Transport Properties by Photomixing, article, November 19, 1998; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc791708/: accessed January 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.