Single-beam photothermal microscopy - a new diagnostic tool for optical materials

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A novel photothermal microscopy (PTM) is developed which uses only one laser beam, working as both the pump and the probe. The principle of this single-beam PTM is based on the detection of the second harmonic component of the laser modulated scattering (LMS) signal. This component has a linear dependence on the optical absorptance of the tested area and a quadratic dependence on the pump laser power. Using a pump laser at the wavelengths of 514.5- and 532-nm high-resolution photothermal scans are performed for polished fused silica surfaces and a HfO{sub 2}/SiO{sub 2} multilayer coatings. The results are compared with ... continued below

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1369 Kilobytes pages

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Feit, M. D.; Kozlowski, M.; Natoli, J. Y.; Rubenchik, A. M.; Sheehan, L.; Wu, Z. L. et al. December 22, 1998.

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Description

A novel photothermal microscopy (PTM) is developed which uses only one laser beam, working as both the pump and the probe. The principle of this single-beam PTM is based on the detection of the second harmonic component of the laser modulated scattering (LMS) signal. This component has a linear dependence on the optical absorptance of the tested area and a quadratic dependence on the pump laser power. Using a pump laser at the wavelengths of 514.5- and 532-nm high-resolution photothermal scans are performed for polished fused silica surfaces and a HfO{sub 2}/SiO{sub 2} multilayer coatings. The results are compared with those from the traditional two-beam PTM mapping. It is demonstrated that the single-beam PTM is more user-friendly (i.e. no alignment is needed) than conventional two-beam PTM and, offers a higher spatial resolution for defect detection.

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1369 Kilobytes pages

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  • 30th Boulder Damage Symposium: Annual Symposium on Optical Materials for High Power Lasers, Boulder, CO (US), 09/28/1998--10/01/1998

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  • Report No.: UCRL-JC-131212
  • Report No.: DP0212000
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 8354
  • Archival Resource Key: ark:/67531/metadc788887

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  • December 22, 1998

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  • Dec. 3, 2015, 9:30 a.m.

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  • May 6, 2016, 2:01 p.m.

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Feit, M. D.; Kozlowski, M.; Natoli, J. Y.; Rubenchik, A. M.; Sheehan, L.; Wu, Z. L. et al. Single-beam photothermal microscopy - a new diagnostic tool for optical materials, article, December 22, 1998; California. (digital.library.unt.edu/ark:/67531/metadc788887/: accessed August 18, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.